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Items where Author is "Dowsett, M"

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Belykh, SF, Palitsin, VV, Veryovkin, IV, Kovarsky, AP, Chang, RJH, Adriaens, A, Dowsett, MG and Adams, F (2007) New Cs sputter ion source with polyatomic ion beams for secondary ion mass spectrometry applications REVIEW OF SCIENTIFIC INSTRUMENTS, 78 (8), ARTN 08510.

Palitsin, VV, Dowsett, MG, de la Mata, BG, Oloff, IW and Gibbons, R (2006) uleSIMS characterization of silver reference surfaces APPLIED SURFACE SCIENCE, 252 (19). pp. 7132-7135.

Conference or Workshop Item

Belykh, SF, Palitsin, V, Veryovkin, IV, Kovarsky, AP, Chang, RJH, Adriaens, A, Dowsett, M and Adams, F (2006) Caesium sputter ion source compatible with commercial SIMS instruments In: 15th International Conference on Secondary Ion Mass Spectrometry (SIMS XV), 2005-09-12 - 2005-09-16, Univ Manchester, Manchester, ENGLAND.

de la Mata, BG, Dowsett, MG and Palitsin, V (2005) Ultra-low energy SIMS study of ultra-shallow boron implants in HPHT diamond In: 10th International Workshop on Surface and Bulk Defects in CVD Diamond Films, 2005-02-23 - 2005-02-25, Diepenbee-Hasselt, BELGIUM.

Mironov, OA, Phillips, PJ, Parker, EHC, Dowsett, MG, Barradas, NP, Jeynes, C, Mironov, M, Gnezdilov, VP, Ushakov, V and Eremenko, VV (1997) Structural and optical characterisation of undoped Si-Si0.78Ge0.22/Si(001) superlattices grown by MBE In: Workshop on Molecular Beam Expitaxy-Growth Physics and Technology (MBE-GPT 96), 1996-10-21 - 1996-10-25, WARSAW, POLAND.

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