Items where Author is "Belykh, S"

Article

Belykh, SF, Palitsin, VV, Veryovkin, IV, Kovarsky, AP, Chang, RJH, Adriaens, A, Dowsett, MG and Adams, F (2007) New Cs sputter ion source with polyatomic ion beams for secondary ion mass spectrometry applications REVIEW OF SCIENTIFIC INSTRUMENTS, 78 (8), ARTN 08510.

Conference or Workshop Item

Belykh, SF, Palitsin, V, Veryovkin, IV, Kovarsky, AP, Chang, RJH, Adriaens, A, Dowsett, M and Adams, F (2006) Caesium sputter ion source compatible with commercial SIMS instruments In: 15th International Conference on Secondary Ion Mass Spectrometry (SIMS XV), 2005-09-12 - 2005-09-16, Univ Manchester, Manchester, ENGLAND.