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Metrology of complex refractive index for solids in the terahertz regime using frequency domain spectroscopy

Chick, Steven, Murdin, B N, Matmon, Guy and Naftaly, Mira (2018) Metrology of complex refractive index for solids in the terahertz regime using frequency domain spectroscopy Metrologia, 55 (6). pp. 771-781.

Metrology of complex refractive index for solids in the terahertz regime using frequency domain spectroscopy.pdf - Accepted version Manuscript
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Frequency domain spectroscopy allows an experimenter to establish optical properties of solids in a wide frequency band including the technically challenging 3-10 THz region, and in other bands enables metrological comparison between competing techniques. We advance a method for extracting the optical properties of high-index solids using only transmission-mode frequency domain spectroscopy of plane-parallel Fabry-Perot optical flats. We show that different data processing techniques yield different kinds of systematic error, and that some commonly used techniques have inherent systematic errors which are underappreciated. We use model datasets to cross-compare algorithms in isolation from experimental errors, and propose a new algorithm which has qualitatively different systematic errors to its competitors. We show that our proposal is more robust to experimental non-idealities such as noise or apodization, and extract the complex refractive index spectrum of crystalline silicon as a practical example. Finally, we advance the idea that algorithms are complementary rather than competitive, and should be used as part of a toolbox for better metrology.

Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Physics
Authors :
Murdin, B
Matmon, Guy
Naftaly, Mira
Date : 19 October 2018
Funders : Engineering and Physical Sciences Research Council (EPSRC)
DOI : 10.1088/1681-7575/aae2c9
Copyright Disclaimer : © 2018 BIPM & IOP Publishing Ltd. As the Version of Record of this article is going to be/has been published on a subscription basis, this Accepted Manuscript will be available for reuse under a CC BY-NC-ND 3.0 licence after a 12 month embargo period. Although reasonable endeavours have been taken to obtain all necessary permissions from third parties to include their copyrighted content within this article, their full citation and copyright line may not be present in this Accepted Manuscript version. Before using any content from this article, please refer to the Version of Record on IOPscience once published for full citation and copyright details, as permission may be required. All third party content is fully copyright protected, unless specifically stated otherwise in the figure caption of the Version of Record.
Depositing User : Clive Harris
Date Deposited : 02 Oct 2018 10:18
Last Modified : 21 Sep 2019 02:08

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