Quantitative analysis of electrically detected Ramsey fringes in P-doped Si
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Greenland, PT, Matmon, G, Villis, BJ, Bowyer, ET, Li, J, Murdin, BN, van der Meer, AFG, Redlich, B, Pidgeon, CR and Aeppli, G (2015) Quantitative analysis of electrically detected Ramsey fringes in P-doped Si PHYSICAL REVIEW B, 92 (16), ARTN 16531.
Full text not available from this repository.| Item Type: | Article | |||||||||||||||||||||||||||||||||
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| Divisions : | Surrey research (other units) | |||||||||||||||||||||||||||||||||
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| Date : | 13 October 2015 | |||||||||||||||||||||||||||||||||
| DOI : | 10.1103/PhysRevB.92.165310 | |||||||||||||||||||||||||||||||||
| Uncontrolled Keywords : | Science & Technology, Physical Sciences, Physics, Condensed Matter, Physics, RYDBERG STATES, SILICON, GENERATION, GERMANIUM, DONORS | |||||||||||||||||||||||||||||||||
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| Depositing User : | Symplectic Elements | |||||||||||||||||||||||||||||||||
| Date Deposited : | 17 May 2017 13:45 | |||||||||||||||||||||||||||||||||
| Last Modified : | 25 Jan 2020 00:20 | |||||||||||||||||||||||||||||||||
| URI: | http://epubs.surrey.ac.uk/id/eprint/840257 |
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