Energetic ion impacts on quartz surfaces: A study by atomic force microscopy
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Wilson, IH, Xu, JB, Devine, RAB and Webb, RP (1996) Energetic ion impacts on quartz surfaces: A study by atomic force microscopy NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 118 (1-4). pp. 473-477.
Full text not available from this repository.Item Type: | Article | |||||||||||||||
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Divisions : | Surrey research (other units) | |||||||||||||||
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Date : | 1 September 1996 | |||||||||||||||
DOI : | 10.1016/0168-583X(95)01477-2 | |||||||||||||||
Uncontrolled Keywords : | Science & Technology, Technology, Physical Sciences, Instruments & Instrumentation, Nuclear Science & Technology, Physics, Atomic, Molecular & Chemical, Physics, Nuclear, Physics, INSTRUMENTS & INSTRUMENTATION, NUCLEAR SCIENCE & TECHNOLOGY, PHYSICS, ATOMIC, MOLECULAR & CHEMICAL, PHYSICS, NUCLEAR, SCANNING TUNNELING MICROSCOPY | |||||||||||||||
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Depositing User : | Symplectic Elements | |||||||||||||||
Date Deposited : | 17 May 2017 12:17 | |||||||||||||||
Last Modified : | 24 Jan 2020 22:00 | |||||||||||||||
URI: | http://epubs.surrey.ac.uk/id/eprint/834755 |
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