Quantitative electrostatic force microscopy-phase measurements
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Lei, CH, Das, A, Elliott, M and Macdonald, JE (2004) Quantitative electrostatic force microscopy-phase measurements NANOTECHNOLOGY, 15 (5), PII S0957-. pp. 627-634.
Full text not available from this repository.| Item Type: | Article | |||||||||||||||
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| Divisions : | Surrey research (other units) | |||||||||||||||
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| Date : | 1 May 2004 | |||||||||||||||
| DOI : | 10.1088/0957-4484/15/5/038 | |||||||||||||||
| Uncontrolled Keywords : | Science & Technology, Technology, Physical Sciences, Nanoscience & Nanotechnology, Materials Science, Multidisciplinary, Physics, Applied, Science & Technology - Other Topics, Materials Science, Physics, MATERIALS SCIENCE, MULTIDISCIPLINARY, NANOSCIENCE & NANOTECHNOLOGY, PHYSICS, APPLIED, KELVIN PROBE MICROSCOPY, CONTACT POTENTIAL DIFFERENCE, FIELD-EFFECT TRANSISTORS, RESOLUTION, SURFACE, CONDUCTIVITY, TRANSPORT, CHARGE, DNA | |||||||||||||||
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| Depositing User : | Symplectic Elements | |||||||||||||||
| Date Deposited : | 17 May 2017 12:01 | |||||||||||||||
| Last Modified : | 24 Jan 2020 21:36 | |||||||||||||||
| URI: | http://epubs.surrey.ac.uk/id/eprint/833699 |
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