THE ANALYSIS OF THE TEMPERATURE-DEPENDENCE OF PHOTOCONDUCTIVE FREQUENCY-RESOLVED SPECTROSCOPY IN THE PRESENCE OF CARRIER TRAPPING - APPLICATION TO POLYCRYSTALLINE SILICON
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LOURENCO, MA, HOMEWOOD, KP and MCLELLAN, RD (1993) THE ANALYSIS OF THE TEMPERATURE-DEPENDENCE OF PHOTOCONDUCTIVE FREQUENCY-RESOLVED SPECTROSCOPY IN THE PRESENCE OF CARRIER TRAPPING - APPLICATION TO POLYCRYSTALLINE SILICON JOURNAL OF APPLIED PHYSICS, 73 (6). pp. 2958-2964.
Full text not available from this repository.| Item Type: | Article | ||||||||||||
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| Divisions : | Surrey research (other units) | ||||||||||||
| Authors : |
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| Date : | 15 March 1993 | ||||||||||||
| Uncontrolled Keywords : | Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED | ||||||||||||
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| Depositing User : | Symplectic Elements | ||||||||||||
| Date Deposited : | 17 May 2017 11:44 | ||||||||||||
| Last Modified : | 24 Jan 2020 21:11 | ||||||||||||
| URI: | http://epubs.surrey.ac.uk/id/eprint/832521 |
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