GaBi alloy liquid metal ion source for microelectronics research
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Bischoff, L, Pilz, W, Ganetsos, T, Forbes, RG and Akhmadaliev, C (2007) GaBi alloy liquid metal ion source for microelectronics research ULTRAMICROSCOPY, 107 (9). pp. 865-868.
Full text not available from this repository.| Item Type: | Article | ||||||||||||||||||
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| Divisions : | Surrey research (other units) | ||||||||||||||||||
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| Date : | 1 September 2007 | ||||||||||||||||||
| DOI : | 10.1016/j.ultramic.2007.02.022 | ||||||||||||||||||
| Uncontrolled Keywords : | Science & Technology, Technology, Microscopy, MICROSCOPY, GaBi alloy liquid metal ion source, mass spectra, abundance, SILICON | ||||||||||||||||||
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| Depositing User : | Symplectic Elements | ||||||||||||||||||
| Date Deposited : | 17 May 2017 11:35 | ||||||||||||||||||
| Last Modified : | 24 Jan 2020 21:01 | ||||||||||||||||||
| URI: | http://epubs.surrey.ac.uk/id/eprint/831945 |
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