Quantification of Au deposited on Ni: XPS peak shape analysis compared to RES
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Simonsen, AC, Pohler, JP, Jeynes, C and Tougaard, S (1999) Quantification of Au deposited on Ni: XPS peak shape analysis compared to RES SURFACE AND INTERFACE ANALYSIS, 27 (1). pp. 52-56.
Full text not available from this repository.| Item Type: | Article | |||||||||||||||
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| Divisions : | Surrey research (other units) | |||||||||||||||
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| Date : | 1 January 1999 | |||||||||||||||
| Uncontrolled Keywords : | Science & Technology, Physical Sciences, Chemistry, Physical, Chemistry, CHEMISTRY, PHYSICAL, quantitative XPS, RBS, thin films, inelastic peak shape analysis, RAY PHOTOELECTRON-SPECTROSCOPY, QUANTITATIVE-ANALYSIS, NANOSTRUCTURE, GROWTH, FILMS | |||||||||||||||
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| Depositing User : | Symplectic Elements | |||||||||||||||
| Date Deposited : | 17 May 2017 11:31 | |||||||||||||||
| Last Modified : | 24 Jan 2020 20:57 | |||||||||||||||
| URI: | http://epubs.surrey.ac.uk/id/eprint/831696 |
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