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Bayesian error analysis of Rutherford backscattering spectra

Barradas, NP, Jeynes, C, Jenkin, M and Marriott, PK (1999) Bayesian error analysis of Rutherford backscattering spectra THIN SOLID FILMS, 343. pp. 31-34.

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Item Type: Article
Divisions : Surrey research (other units)
Authors :
Barradas, NP
Jenkin, M
Marriott, PK
Date : 1 April 1999
DOI : 10.1016/S0040-6090(98)01681-2
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Materials Science, Multidisciplinary, Materials Science, Coatings & Films, Physics, Applied, Physics, Condensed Matter, Materials Science, Physics, MATERIALS SCIENCE, COATINGS & FILMS, MATERIALS SCIENCE, MULTIDISCIPLINARY, PHYSICS, APPLIED, PHYSICS, CONDENSED MATTER, Bayesian inference, Markov chain Monte Carlo, Rutherford backscattering, ion beam analysis, ANNEALING ANALYSIS
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 17 May 2017 11:31
Last Modified : 24 Jan 2020 20:56

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