Accurate depth profiling of complex optical coatings
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Jeynes, C, Barradas, NP, Rafla-Yuan, H, Hichwa, BP and Close, R (2000) Accurate depth profiling of complex optical coatings SURFACE AND INTERFACE ANALYSIS, 30 (1). pp. 237-242.
Full text not available from this repository.| Item Type: | Article | ||||||||||||||||||
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| Divisions : | Surrey research (other units) | ||||||||||||||||||
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| Date : | 1 August 2000 | ||||||||||||||||||
| Uncontrolled Keywords : | Science & Technology, Physical Sciences, Chemistry, Physical, Chemistry, CHEMISTRY, PHYSICAL, RES, simulated annealing, optical coatings, thin-film structure, RUTHERFORD BACKSCATTERING DATA, IBA METHODS, RESOLUTION, RBS, SIMULATION | ||||||||||||||||||
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| Depositing User : | Symplectic Elements | ||||||||||||||||||
| Date Deposited : | 17 May 2017 11:31 | ||||||||||||||||||
| Last Modified : | 24 Jan 2020 20:56 | ||||||||||||||||||
| URI: | http://epubs.surrey.ac.uk/id/eprint/831675 |
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