A comparison of in situ polishing and ion beam sputtering as surface preparation methods for XPS analysis of PVD coatings

Baker, MA, Greaves, SJ, Wendler, E and Fox, V (2000) A comparison of in situ polishing and ion beam sputtering as surface preparation methods for XPS analysis of PVD coatings In: 27th International Conference on Metallurgical Coatings and Thin Films, 2000-04-10 - 2000-04-14, SAN DIEGO, CALIFORNIA.

Full text not available from this repository.

Item Type:	Conference or Workshop Item (UNSPECIFIED)
Divisions :	Surrey research (other units)
Authors :	Name Email ORCID Baker, MA m.baker@surrey.ac.uk Greaves, SJ Wendler, E Fox, V
Date :	1 December 2000
DOI :	10.1016/S0040-6090(00)01272-4
Contributors :	Contribution Name Email ORCID publisher ELSEVIER SCIENCE SA,
Uncontrolled Keywords :	Science & Technology, Technology, Physical Sciences, Materials Science, Multidisciplinary, Materials Science, Coatings & Films, Physics, Applied, Physics, Condensed Matter, Materials Science, Physics, MATERIALS SCIENCE, COATINGS & FILMS, MATERIALS SCIENCE, MULTIDISCIPLINARY, PHYSICS, APPLIED, PHYSICS, CONDENSED MATTER, XPS, in situ polishing, sputtering, PVD coatings, RAY PHOTOELECTRON-SPECTROSCOPY, AUGER-ELECTRON SPECTROSCOPY, BACKSCATTERING, FILMS, TIN
Related URLs :	Author
Depositing User :	Symplectic Elements
Date Deposited :	17 May 2017 11:27
Last Modified :	23 Jan 2020 16:52
URI:	http://epubs.surrey.ac.uk/id/eprint/831437

Actions (login required)

View Item

Downloads