Thick film compound semiconductors for X-ray imaging applications
Tools
Tools
Tools
Sellin, PJ (2006) Thick film compound semiconductors for X-ray imaging applications In: 7th International Workshop on Radiation Imaging Detectors, 2005-07-04 - 2005-07-07, Grenoble, FRANCE.
Full text not available from this repository.| Item Type: | Conference or Workshop Item (UNSPECIFIED) | ||||||||
|---|---|---|---|---|---|---|---|---|---|
| Divisions : | Surrey research (other units) | ||||||||
| Authors : |
|
||||||||
| Date : | 1 July 2006 | ||||||||
| DOI : | 10.1016/j.nima.2006.01.110 | ||||||||
| Contributors : |
|
||||||||
| Uncontrolled Keywords : | Science & Technology, Technology, Physical Sciences, Instruments & Instrumentation, Nuclear Science & Technology, Physics, Particles & Fields, Spectroscopy, Physics, INSTRUMENTS & INSTRUMENTATION, NUCLEAR SCIENCE & TECHNOLOGY, PHYSICS, PARTICLES & FIELDS, SPECTROSCOPY, IODIDE POLYCRYSTALLINE FILMS, RADIATION DETECTORS, ENERGY RESOLUTION, PANEL DETECTORS, LARGE-AREA, HGI2, DEPOSITION, GROWTH, RADIOGRAPHY, TEMPERATURE | ||||||||
| Related URLs : | |||||||||
| Depositing User : | Symplectic Elements | ||||||||
| Date Deposited : | 17 May 2017 11:20 | ||||||||
| Last Modified : | 23 Jan 2020 16:45 | ||||||||
| URI: | http://epubs.surrey.ac.uk/id/eprint/830981 |
Actions (login required)
 |
View Item |
Downloads
Downloads per month over past year