W-band noise figure measurement designed for on-wafer characterisation

Drury, R, Pollard, RD and Snowden, CM (1996) W-band noise figure measurement designed for on-wafer characterisation In: 1996 IEEE MTT-S International Microwave Symposium, 1996-06-17 - 1996-06-21, SAN FRANCISCO, CA.

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Item Type:	Conference or Workshop Item (UNSPECIFIED)
Divisions :	Surrey research (other units)
Authors :	Name Email ORCID Drury, R Pollard, RD Snowden, CM c.snowden@surrey.ac.uk
Date :	1 January 1996
Contributors :	Contribution Name Email ORCID Ranson, RG Pollard, RD publisher I E E E,
Uncontrolled Keywords :	Science & Technology, Technology, Engineering, Electrical & Electronic, Engineering
Related URLs :	Author
Depositing User :	Symplectic Elements
Date Deposited :	16 May 2017 12:32
Last Modified :	23 Jan 2020 13:21
URI:	http://epubs.surrey.ac.uk/id/eprint/814215

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