XPS and PIXE Analysis of Doped Silica Fibre for Radiation Dosimetry

Sani, SFA, Mahdiraji, GA, Shafiqah, ASS, Grime, GW, Palitsin, V, Hinder, SJ, Tamchek, N, Rashid, HAA, Maah, MJ, Watts, JF et al and Bradley, DA (2015) XPS and PIXE Analysis of Doped Silica Fibre for Radiation Dosimetry JOURNAL OF LIGHTWAVE TECHNOLOGY, 33 (11). pp. 2268-2278.

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Item Type:	Article
Divisions :	Surrey research (other units)
Authors :	Sani, SFA, Mahdiraji, GA, Shafiqah, ASS, Grime, GW, Palitsin, V, Hinder, SJ, Tamchek, N, Rashid, HAA, Maah, MJ, Watts, JF and Bradley, DA
Date :	1 June 2015
DOI :	10.1109/JLT.2015.2406394
Uncontrolled Keywords :	Science & Technology, Technology, Physical Sciences, Engineering, Electrical & Electronic, Optics, Telecommunications, Engineering, Doped SiO2 fibres, dosimetry, particle-induced X-ray emission (PIXE), photonic crystal fibre (PCF), X-ray photoelectron spectroscopy (XPS), PHOTONIC CRYSTAL FIBERS, ABSORPTION-BANDS, OPTICAL-FIBERS, SIO2, GE, GENERATION, GERMANIUM, DEFECTS, GLASSES
Related URLs :	Author
Depositing User :	Symplectic Elements
Date Deposited :	28 Mar 2017 10:57
Last Modified :	24 Jan 2020 12:42
URI:	http://epubs.surrey.ac.uk/id/eprint/809223

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