A Comparative Study of the Native Oxide on 316L Stainless Steel by XPS and ToF-SIMS

Watts, JF, Tardio, S, Abel, M-L, Carr, RH and Castle, JE (2015) A Comparative Study of the Native Oxide on 316L Stainless Steel by XPS and ToF-SIMS Journal of Vacuum Science and Technology Part A: International Journal Devoted to Vacuum, Surfaces, and Films, 33 (5).

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Abstract

The very thin native oxide film on stainless steel, of the order of 2 nm, is known to be readily modified by immersion in aqueous media. In this paper, XPS and ToF-SIMS are employed to investigate the nature of the air-formed film and modification after water emmersion. The film is described in terms of oxide, hydroxide and water content. The preferential dissolution of iron is shown to occur on immersion. It is shown that a water absorbed layer and a hydroxide layer are present above the oxide-like passive film. The concentrations of water and hydroxide appear to be higher in the case of exposure to water. A secure method for the peak fitting of Fe2p and Cr2p XPS spectra of such films on their metallic substrates is described. The importance of XPS survey spectra is underlined and the feasibility of C60+ SIMS depth profiling of a thin oxide layer is shown.

Item Type:	Article
Divisions :	Faculty of Engineering and Physical Sciences > Mechanical Engineering Sciences
Authors :	Name Email ORCID Watts, JF Tardio, S Abel, M-L Carr, RH Castle, JE
Date :	1 September 2015
DOI :	10.1116/1.4927319
Uncontrolled Keywords :	AISI 316 stainless steel, native oxide, water emersion, XPS, Peak fitting, ToF-SIMS, Depth profile
Additional Information :	Copyright 2015 American Vacuum Society.
Depositing User :	Symplectic Elements
Date Deposited :	18 Aug 2015 11:30
Last Modified :	18 Aug 2015 11:30
URI:	http://epubs.surrey.ac.uk/id/eprint/808218

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