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A novel high resolution E-field microscope system with applications in HPA diagnostics

Dehghan, N, Porch, A, Cripps, SC and Aaen, PH (2011) A novel high resolution E-field microscope system with applications in HPA diagnostics 78th ARFTG Microwave Measurement Conference: High Power RF Measurement Techniques, ARFTG 2011.

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A new type of high resolution E-field microscope system is described. The system is based on a novel design of an active E-field probe (EFP) probe, which is both nonintrusive and displays high spatial resolution. This paper focuses on the construction and spatial resolution of the probe, which shows significant evolution from that previously reported [1], and some measurements on passive structures which indicate that features smaller than 100 microns can be individually resolved. The probe construction lends itself to further improvements in spatial resolution. Measurement results are presented which demonstrate the high resolution of the probe, and its potential utility in measuring waveforms with high spatial resolution at individual points on microwave circuits, discrete devices, and integrated circuits. © 2011 IEEE.

Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute
Authors :
Dehghan, N
Porch, A
Cripps, SC
Aaen, PH
Date : 2011
DOI : 10.1109/ARFTG78.2011.6183871
Contributors :
Additional Information : © 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Depositing User : Symplectic Elements
Date Deposited : 26 Sep 2013 15:33
Last Modified : 31 Oct 2017 15:15

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