Thickness dependence of properties of excimer laser crystallized nano-polycrystalline silicon
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Adikaari, AADT and Silva, SRP (2005) Thickness dependence of properties of excimer laser crystallized nano-polycrystalline silicon JOURNAL OF APPLIED PHYSICS, 97 (11), ARTN 1.
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Official URL: http://dx.doi.org/10.1063/1.1898444
| Item Type: | Article | |||||||||
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| Divisions : | Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Nano-Electronics Centre | |||||||||
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| Date : | 1 June 2005 | |||||||||
| DOI : | 10.1063/1.1898444 | |||||||||
| Uncontrolled Keywords : | Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED, THIN-FILM TRANSISTORS, HYDROGENATED AMORPHOUS-SILICON, CHEMICAL-VAPOR-DEPOSITION, SUPER-LATERAL GROWTH, A-SI-H, MICROCRYSTALLINE SILICON, SOLAR-CELLS, RAMAN-SPECTROSCOPY, VOLUME FRACTION, LOW-TEMPERATURE | |||||||||
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| Depositing User : | Mr Adam Field | |||||||||
| Date Deposited : | 27 May 2010 14:05 | |||||||||
| Last Modified : | 31 Oct 2017 13:56 | |||||||||
| URI: | http://epubs.surrey.ac.uk/id/eprint/8 |
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