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Carbon coatings with low secondary electron yield

Costa Pinto, P, Calatroni, S, Neupert, H, Letant-Delrieux, D, Edwards, P, Chiggiato, P, Taborelli, M, Vollenberg, W, Yin-Vallgren, C, Colaux, JL and Lucas, S (2013) Carbon coatings with low secondary electron yield Vacuum, 98. pp. 29-36.

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Carbon thin films for electron cloud mitigation and anti-multipacting applications have been prepared by dc magnetron sputtering in both neon and argon discharge gases and by plasma enhanced chemical vapour deposition (PECVD) using acetylene. The thin films have been characterized using Secondary Electron Yield (SEY) measurements, Scanning Electron Microscopy (SEM), Nuclear Reaction Analysis (NRA) and X-ray Photoemission Spectroscopy (XPS). For more than 100 carbon thin films prepared by sputtering the average maximum SEY is 0.98 ± 0.07 after air transfer. The density of the films is lower than the density of Highly Oriented Pyrolytic Graphite (HOPG), a fact which partially explains their lower SEY. XPS shows that magnetron sputtered samples exhibit mainly sp type bonds. The intensity on the high binding energy side of C1s is found to be related to the value of the SEY. In addition the initial surface concentration of oxygen has no influence on the resulting SEY, when it is below 16%. The thin films produced by PECVD have a much higher maximum SEY of 1.49 ± 0.07. Storage conditions in air, namely wrapping in aluminium foil, preserves the low SEY by more than one year. Such coatings have already been applied successfully in accelerators and multipacting test benches. © 2013 Elsevier Ltd. All rights reserved.

Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Ion Beam Centre
Authors :
Costa Pinto, P
Calatroni, S
Neupert, H
Letant-Delrieux, D
Edwards, P
Chiggiato, P
Taborelli, M
Vollenberg, W
Yin-Vallgren, C
Colaux, JL
Lucas, S
Date : 2013
DOI : 10.1016/j.vacuum.2013.03.001
Additional Information : NOTICE: this is the author’s version of a work that was accepted for publication in Vacuum. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Vacuum xxx, March 2013, DOI 10.1016/j.vacuum.2013.03.001.
Depositing User : Symplectic Elements
Date Deposited : 03 May 2013 09:21
Last Modified : 31 Oct 2017 15:04

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