Electron beam quality control using an amorphous silicon EPID
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Beck, JA, Budgell, GJ, Roberts, DA and Evans, PM (2009) Electron beam quality control using an amorphous silicon EPID MEDICAL PHYSICS, 36 (5). pp. 1859-1866.
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Official URL: http://dx.doi.org/10.1118/1.3110671
| Item Type: | Article | |||||||||||||||
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| Divisions : | Faculty of Engineering and Physical Sciences > Electronic Engineering > Centre for Vision Speech and Signal Processing | |||||||||||||||
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| Date : | May 2009 | |||||||||||||||
| DOI : | 10.1118/1.3110671 | |||||||||||||||
| Uncontrolled Keywords : | amorphous semiconductors, biomedical equipment, biomedical imaging, electron beams, linear accelerators, quality control, radiation therapy, silicon radiation detectors | |||||||||||||||
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| Depositing User : | Symplectic Elements | |||||||||||||||
| Date Deposited : | 05 Mar 2013 10:07 | |||||||||||||||
| Last Modified : | 31 Oct 2017 14:53 | |||||||||||||||
| URI: | http://epubs.surrey.ac.uk/id/eprint/738900 |
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