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Structural and electronic characterization of nanocrystalline diamondlike carbon thin films

Dwivedi, N, Kumar, S, Tripathi, RK, Dalai, MK, Dwivedi, N, Malik, HK and Carey, JD (2012) Structural and electronic characterization of nanocrystalline diamondlike carbon thin films ACS Applied Materials and Interfaces, 4 (10). pp. 5309-5316.

ACS Applied Materials 4, 5309 (2012).pdf
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The origin of low threshold field-emission (threshold field 1.25 V/μm) in nanocrystalline diamond-like carbon (nc-DLC) thin films is examined. The introduction of nitrogen and thermal annealing are both observed to change the threshold field and these changes are correlated with changes to the film microstructure. A range of different techniques including micro-Raman and infrared spectroscopy, X-ray diffraction, electron microscopy, energy-dispersive X-ray analysis and time-of-flight-secondary ion mass spectroscopy are used to examine the properties of the films. A comparison of the field emission properties of nc-DLC films with atomically smooth amorphous DLC (a-DLC) films reveals that nc-DLC films have lower threshold fields. Our results show that nc-DLC can be a good candidate for large area field emission display panels and cold cathode emission devices. © 2012 American Chemical Society.

Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Nano-Electronics Centre
Authors :
Dwivedi, N
Kumar, S
Tripathi, RK
Dalai, MK
Dwivedi, N
Malik, HK
Carey, JD
Date : 24 October 2012
DOI : 10.1021/am301252e
Uncontrolled Keywords : Diamond like carbon, Field emission mechanisms, Fowler-Nordheim tunneling, PECVD of carbon
Additional Information : This document is the Accepted Manuscript version of a Published Work that appeared in final form in ACS Applied Materials and Interfaces, copyright © American Chemical Society after peer review and technical editing by the publisher.To access the final edited and published work see
Depositing User : Symplectic Elements
Date Deposited : 20 Dec 2012 12:27
Last Modified : 31 Oct 2017 14:52

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