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Characterisation of thin film chalcogenide PV materials using MeV ion beam analysis

Jeynes, C, Zoppi, G, Forbes, I, Bailey, MJ and Peng, N (2009) Characterisation of thin film chalcogenide PV materials using MeV ion beam analysis In: International Conference on Sustainable Power Generation and Supply, 2009-04-06 - 2009-04-07, Nanjing, PEOPLES R CHINA.

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Item Type: Conference or Workshop Item (Conference Paper)
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Ion Beam Centre
Authors :
Jeynes, C
Zoppi, G
Forbes, I
Bailey, MJ
Peng, N
Date : 1 January 2009
Contributors :
Uncontrolled Keywords : Science & Technology, Technology, Energy & Fuels, Engineering, Electrical & Electronic, Engineering, Photovoltaic cell materials, Materials science and technology, Semiconductor films, Thin film devices, Ion beam applications, SIMULTANEOUS PIXE, CROSS-SECTION, RBS, SOFTWARE, IBA, DATAFURNACE, SCATTERING, ROUGHNESS, SILICON
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Additional Information :

Copyright 2009 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

Depositing User : Symplectic Elements
Date Deposited : 12 Oct 2012 11:44
Last Modified : 31 Oct 2017 14:42

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