Near edge x-ray absorption fine structure study of aligned pi-bonded carbon structures in nitrogenated ta-C films
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Roy, SS, McCann, R, Papakonstantinou, P, McLaughlin, JA, Kirkman, IW, Bhattacharyya, S and Silva, SRP (2006) Near edge x-ray absorption fine structure study of aligned pi-bonded carbon structures in nitrogenated ta-C films JOURNAL OF APPLIED PHYSICS, 99 (4), ARTN 0.
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| Item Type: | Article | ||||||||||||||||||||||||
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| Divisions : | Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Nano-Electronics Centre | ||||||||||||||||||||||||
| Authors : |
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| Date : | 15 February 2006 | ||||||||||||||||||||||||
| DOI : | 10.1063/1.2173046 | ||||||||||||||||||||||||
| Uncontrolled Keywords : | Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED, TETRAHEDRAL AMORPHOUS-CARBON, THIN-FILMS, BONDING MODIFICATIONS, DEFECT DENSITY, NITRIDE, RAMAN, SPECTROSCOPY, REDUCTION, EMISSION, SPECTRA | ||||||||||||||||||||||||
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| Depositing User : | Mr Adam Field | ||||||||||||||||||||||||
| Date Deposited : | 27 May 2010 14:09 | ||||||||||||||||||||||||
| Last Modified : | 31 Oct 2017 13:58 | ||||||||||||||||||||||||
| URI: | http://epubs.surrey.ac.uk/id/eprint/463 |
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