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Thickness Dependence of Hall Transport in Ni1.15Mn0.85Sb Thin Films on Silicon

Branford, W R, Clowes, S K, Bugoslavsky, Y V, Gardelis, S, Androulakis, J, Giapintzakis, J, Grigorescu, C E A, Manea, S A, Freitas, R S, Roy, S B and Cohen, L F (2004) Thickness Dependence of Hall Transport in Ni1.15Mn0.85Sb Thin Films on Silicon Physical Review B, 69 (20).


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Highly spin polarized Heusler alloys, NiMnSb and Co2MnSi, attract a great deal of interest as potential spin injectors for spintronic applications. Spintronic devices require control of interfacial properties at the ferromagnet:semiconductor contact. To address this issue we report a systematic study of the ordinary and anomalous Hall effect, in Ni1.15Mn0.85Sb films on silicon, as a function of film thickness. In contrast to the bulk stoichiometric material, the Hall carriers in these films become increasingly electron-like as the film thickness decreases, and as the temperature increases from 50 K toward room temperature. High field Hall measurements confirm that this is representative of the majority transport carriers. This suggests that current injected from a NiMnSb:semiconductor interface may not necessarily carry the bulk spin polarization. The films also show a low temperature upturn in the resistivity, which is linked to a discontinuity in the anomalous Hall coefficient. Overall these trends indicate that the application of Heusler alloys as spin injectors will require strictly controlled interfacial engineering, which is likely to be demanding in these ternary alloys.

Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Photonics
Faculty of Engineering and Physical Sciences > Physics
Authors :
Branford, W R
Clowes, S
Bugoslavsky, Y V
Gardelis, S
Androulakis, J
Giapintzakis, J
Grigorescu, C E A
Manea, S A
Freitas, R S
Roy, S B
Cohen, L F
Date : 1 January 2004
DOI : 10.1103/PhysRevB.69.201305
Additional Information : Branford, W. R., Clowes, S. K., Bugoslavsky, Y. V., Gardelis, S., Androulakis, J., Giapintzakis, J., Grigorescu, C. E. A., Manea, S. A., Freitas, R. S., Roy, S. B., and Cohen, L. F. (2004) Thickness Dependence of Hall Transport in Ni<sub>1.15</sub>Mn<sub>0.85</sub>Sb Thin Films on Silicon. <i>Physical Review B,</i> Vol. 69, Iss. 20, Article 201305. © 2004 The American Physical Society Click <a href= >here</a> to visit the journal's website. This article was published when S. K. Clowes was with Imperial College, London.
Depositing User : Mr Adam Field
Date Deposited : 27 May 2010 14:44
Last Modified : 16 Jan 2019 16:22

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