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Band gap reduction in GaNSb alloys due to the anion mismatch

Veal, T. D., Piper, L. F. J., Jollands, S., Bennett, B. R., Jefferson, P. H., Thomas, P. A., McConville, C. F., Murdin, B. N., Buckle, L., Smith, G. W. and Ashley, T. (2005) Band gap reduction in GaNSb alloys due to the anion mismatch Applied Physics Letters, 132101 (2005).


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<p>The structural and optoelectronic properties in GaN<i><sub>x</i></sub>Sb<sub>1−<i>x</i></sub> alloys (0≤<i>x</i><0.02) grown by molecular-beam epitaxy on both GaSb substrates and AlSb buffer layers on GaAs substrates are investigated. High-resolution x-ray diffraction (XRD) and reciprocal space mapping indicate that the GaN<i><sub>x</i></sub>Sb<sub>1−<i>x</i></sub> epilayers are of high crystalline quality and the alloy composition is found to be independent of substrate, for identical growth conditions. The band gap of the GaNSb alloys is found to decrease with increasing nitrogen content from absorption spectroscopy. Strain-induced band-gap shifts, Moss-Burstein effects, and band renormalization were ruled out by XRD and Hall measurements. The band-gap reduction is solely due to the substitution of dilute amounts of highly electronegative nitrogen for antimony, and is greater than observed in GaNAs with the same N content.</p>

Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Photonics
Faculty of Engineering and Physical Sciences > Physics
Authors :
Veal, T. D.
Piper, L. F. J.
Jollands, S.
Bennett, B. R.
Jefferson, P. H.
Thomas, P. A.
McConville, C. F.
Murdin, B.
Buckle, L.
Smith, G. W.
Ashley, T.
Date : 19 September 2005
DOI : 10.1063/1.2058224
Additional Information : T. D. Veal et al., Applied Phsyics Letters, 87, 132101(2005). Copyright (2005) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
Depositing User : Mr Adam Field
Date Deposited : 27 May 2010 14:44
Last Modified : 06 Jul 2019 05:07

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