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Number of items: 16.

Obhodas, J, Sudac, D, Matjacic, L and Valkovic, V (2012) Analysis of carbon soil content by using tagged neutron activation

Reed, GT, Thomson, DJ, Gardes, FY, Hu, Y, Owens, N, Yang, X, Petropoulos, P, Debnath, K, O'Faolain, L, Krauss, TF, Lever, L, Ikonic, Z, Kelsall, RW, Myronov, M, Leadley, DR, Marko, IP, Sweeney, SJ, Cox, DC, Brimont, A, Sanchis, P, Duan, G-H, Le Liepvre, A, Jany, C, Lamponi, M, Make, D, Lelarge, F, Fedeli, JM, Messaoudene, S, Keyvaninia, S, Roelkens, G, Van Thourhout, D and Liu, S (2012) High performance silicon optical modulators Proceedings of SPIE - The International Society for Optical Engineering, 8564.

Kohoutek, T, Kawashima, H, Suzuki, T, Ohishi, Y, Hughes, MA, Mastumoto, M and Misumi, T (2012) Highly efficient relief diffraction gratings inscribed on a chalcogenide bulk glass by a femtosecond laser Proceedings of SPIE - The International Society for Optical Engineering, 8428.

Hempel, M, Tomm, JW, Elsaesser, T, Baeumler, M, Konstanzer, H and Mukherjee, J (2012) Near-field characteristics of broad area diode lasers during catastrophic optical damage failure Proceedings of SPIE - The International Society for Optical Engineering, 8432.

Hempel, M, Tomm, JW, Elsaesser, T, Baeumler, M, Konstanzer, H and Mukherjee, J (2012) Near-field evolution in strongly pumped broad area diode lasers Proceedings of SPIE - The International Society for Optical Engineering, 8277.

Loiacono, R, Reed, GT, Mashanovich, GZ, Gwilliam, RM, Lulli, G, Feldesh, R and Jones, R (2011) Low energy silicon on insulator ion implanted gratings for optical wafer scale testing Proceedings of SPIE - The International Society for Optical Engineering, 7943.

Green, JS, Borghesi, M, Brenner, CM, Carroll, DC, Dover, NP, Foster, PS, Gallegos, P, Green, S, Kirby, D and Kirkby, KJ (2011) Scintillator-based ion beam profiler for diagnosing laser-accelerated ion beams Proceedings of SPIE - The International Society for Optical Engineering, 8079, 807919.

Qadir, G, Zhao, X and Ho, ATS (2010) Estimating JPEG2000 compression for image forensics using the Benford's Law Proceedings of SPIE - The International Society for Optical Engineering, 7723.

Loiacono, R, Reed, GT, Gwilliam, R, Mashanovich, GZ, O'Faolain, L, Krauss, T, Lulli, G, Jeynes, C and Jones, R (2010) Germanium implanted Bragg gratings in silicon on insulator waveguides Proceedings of SPIE - The International Society for Optical Engineering, 7606.

Mills, CA, Intaniwet, A, Shkunov, M, Keddie, JL and Sellin, PJ (2009) Flexible radiation dosimeters incorporating semiconducting polymer thick films Proceedings of SPIE - The International Society for Optical Engineering, 7449.

Mills, CA, Intaniwet, A, Shkunov, M, Keddie, JL and Sellin, PJ (2009) Flexible radiation dosimeters incorporating semiconducting polymer thick films In: Hard X-ray, gamma-ray, and neutron detector physics XI, 2009-08-03 - 2009-08-06, San Diego, USA.

Gardes, FY, Reed, GT, Knights, AP, Mashanovich, G, Jessop, PE, Rowe, L, McFaul, S, Bruce, D and Tarr, NG (2008) Sub-micron optical waveguides for silicon photonics formed via the local oxidation of silicon (LOCOS) Proceedings of SPIE - The International Society for Optical Engineering, 6898. 68980R.1-168980R.4.

Hughes, M, Hewak, DW and Curry, RJ (2007) Concentration dependence of the fluorescence decay profile in transition metal doped chalcogenide glass Proceedings of SPIE - The International Society for Optical Engineering, 6469.

Curry, RJ, George, MR and Grossel, MC (2005) The potential of pyridine-2,6-dicarboxylic acid based organolanthanide complexes for efficient near-infrared emission Proceedings of SPIE - The International Society for Optical Engineering, 5937. pp. 1-9.

Hughes, M, Aronson, JE, Brocklesby, WS, Shepherd, DP, Hewak, DW and Curry, RJ (2004) Transition metal-doped chalcogenide glasses for broadband near-infrared sources Proceedings of SPIE - The International Society for Optical Engineering, 5620. pp. 289-296.

Curry, RJ, Gillin, WP, Somerton, M, Knights, AP and Gwilliam, R (2001) Hybrid silicon-organic light emitting diodes for 1.5 μm optoelectronics Proceedings of SPIE - The International Society for Optical Engineering, 4105. pp. 265-271.

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