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Langridge, MT, Cox, DC, Webb, RP and Stolojan, V (2014) The fabrication of aspherical microlenses using focused ion-beam techniques MICRON, 57. 56 - 66.
Bertho, J, Stolojan, V, Abel, M-L and Watts, JF (2010) The effect of silane incorporation on a metal adhesive interface: A study by electron energy loss spectroscopy MICRON, 41 (2). 130 - 134.
Martinez, E, Engel, E, Lopez-Iglesias, C, Mills, CA, Planell, JA and Samitier, J (2008) Focused ion beam/scanning electron microscopy characterization of cell behavior on polymer micro-/nanopatterned substrates: A study of cell-substrate interactions MICRON, 39 (2). 111 - 116.