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Molodtsov, SL, Gurbich, AF and Jeynes, C (2008) Accurate ion beam analysis in the presence of surface roughness JOURNAL OF PHYSICS D-APPLIED PHYSICS, 41 (20). ? - ?. ISSN 0022-3727

Jeynes, C, Barradas, NP, Marriott, PK, Boudreault, G, Jenkin, M, Wendler, E and Webb, RP (2003) Elemental thin film depth profiles by ion beam analysis using simulated annealing - a new tool JOURNAL OF PHYSICS D-APPLIED PHYSICS, 36 (7). R97 - R126. ISSN 0022-3727

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