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Bright, NJ, Webb, R, Hinder, SJ, Kirkby, KJ, Ward, NI, Watts, JF, Bleay, S and Bailey, MJ (2012) Determination of the deposition order of overlapping latent fingerprints and inks using Secondary Ion Mass Spectrometry (SIMS). Anal Chem, 84 (9). 4083 - 4087. ISSN 0003-2700

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