Items where Academic/Research unit is "Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Ion Beam Centre"
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Number of items: 6.
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Bailey, MJ, Coe, S, Grant, DM, Grime, GW and Jeynes, C (2009) Accurate determination of the Ca : P ratio in rough hydroxyapatite samples by SEM-EDS, PIXE and RBS - a comparative study X-RAY SPECTROMETRY, 38 (4). pp. 343-347.
Bailey, MJ and Jeynes, C (2009) Characterisation of gunshot residue particles using self-consistent ion beam analysis NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 267 (12-13). pp. 2265-2268.
Bailey, MJ, Kirkby, KJ and Jeynes, C (2009) Trace element profiling of gunshot residues by PIXE and SEM-EDS: a feasibility study In: 13th European X-Ray Spectrometry Conference (EXRS 2008), 2008-06-16 - 2008-06-20, Cavtat, CROATIA.
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Colaux, JL, Terwagne, G and Louette, P (2009) XPS and NRA depth profiling of nitrogen and carbon simultaneously implanted into copper to synthesize CN like compounds Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 267 (8-9). pp. 1299-1302.
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Jeynes, C and Barradas, NP (2009) Pitfalls in Ion Beam Analysis In: Handbook of Modern Ion Beam Materials Analysis. Materials Research Society, Warrendale Pennsylvania, pp. 347-383. ISBN 1605112151
Jeynes, C, Zoppi, G, Forbes, I, Bailey, MJ and Peng, N (2009) Characterisation of thin film chalcogenide PV materials using MeV ion beam analysis In: International Conference on Sustainable Power Generation and Supply, 2009-04-06 - 2009-04-07, Nanjing, PEOPLES R CHINA.