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Items where Academic/Research unit is "Faculty of Engineering and Physical Sciences > Electronic Engineering"

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Number of items: 12.

A

Armour, et al. (1995) Spectrum analyzer in an ion implanter 5,457,324.

Armour, et al. (1995) Spectrum analyzer in an ion implanter 5,384,465.

E

England, Jonathan, Cook, C., Armour, D. and Foad, M. (1995) Charged particle energy spectrometers and their applications in fundamental studies of wafer charging and ion beam tuning phenomena In: Ion Implantation Technology 94 (IIT 94), 13-17 Jun 1994, Catania, Italy.

England, Jonathan, Cook, C.E.A., Armour, D.G. and Foad, M.A. (1995) Charged particle energy spectrometers and their applications in fundamental studies of wafer charging and ion beam tuning phenomena Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 96 (1-2). pp. 39-42.

F

Foad, M., Armour, D. and England, Jonathan (1995) The Use of KOBRA for Implanter Beamline Design and Optimisation In: Ion Implantation Technology 94 (IIT 94), 13-17 Jun 1994, Catania, Italy.

Foad, M., Armour, D., Kilmes, Z., Hilton, B., Van den Berg, J., Cook, C., Chew, A., Sykes, D., England, Jonathan, Devaney, A., Ito, H., Bryan, N., Plumb, F., Kindersley, P. and Moffatt, S. (1995) Dedicated Test Facility for Ion Beam Quality Evaluation and Spectroscopies In: Ion Implantation Technology 94 (IIT 94), 13-17 Jun 1994, Catania, Italy.

H

Horvath, J., Little, N., Rigsby, D., Anthony, M. and England, Jonathan (1995) Reduction of Boron Cross Contamination During Arsenic Implantation in the Applied Materials Precision Implant 9500 In: Ion Implantation Technology 94 (IIT 94), 13-17 Jun 1994, Catania, Italy.

I

Ito, H., Kamata, T., England, Jonathan, Fotheringham, I., Plumb, F. and Current, M. (1995) The Precision Implant 9500 Plasma Flood System In: Ion Implantation Technology 94 (IIT 94), 13-17 Jun 1994, Catania, Italy.

Ito, et al. (1995) Plasma flood system for the reduction of charging of wafers during ion implantation 5,399,871.

M

Malone, P., Shull, W., England, Jonathan and Fotheringham, I. (1995) A Demonstration using the THOR Monitor that Beam Quality Can Affect Device Yield In: Ion Implantation Technology 94 (IIT 94), 13-17 Jun 1994, Catania, Italy.

P

PLUMBLEY, MD (1995) LYAPUNOV FUNCTIONS FOR CONVERGENCE OF PRINCIPAL COMPONENT ALGORITHMS NEURAL NETWORKS, 8 (1). pp. 11-23.

S

Szajnowski, W., England, Jonathan, Stephens, K., Fotheringham, I., Scargill, D. and Rimini, E. (1995) Measuring a Two Dimensional Profile of an Ion Beam In: Ion Implantation Technology 94 (IIT 94), 13-17 Jun 1994, Catania, Italy.

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