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Items where Author is "Votsi, H"

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Article

Votsi, Haris, Li, C, Aaen, Peter H and Ridler, NM (2017) An Active Interferometric Method for Extreme Impedance On-Wafer Device Measurements IEEE Microwave and Wireless Components Letters., 27 (11). pp. 1034-1036.

Conference or Workshop Item

Votsi, Haris, Roch-Jeune, I, Haddadi, K, Li, C, Dambrine, G, Aaen, Peter and Ridler, N (2017) Development of a Reference Wafer for On-Wafer Testing of Extreme Impedance Devices In: 88th ARFTG Microwave Measurement Symposium, 2016-12-06 - 2016-12-09, Austin, Texas.

This list was generated on Sat Nov 25 11:28:23 2017 UTC.

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