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Items where Author is "Valand, T"

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Diplas, S, Lehrmann, J, Jorgensen, S, Valand, T, Watts, JF and Tafto, J (2005) Characterization of Ni-B amorphous alloys with x-ray photoelectron and secondary ion mass spectroscopy SURFACE AND INTERFACE ANALYSIS, 37 (5). pp. 459-465.

Conference or Workshop Item

Diplas, S, Jorgensen, S, Tafto, J, Tonnessen, T, Knutsen, T, Lehrmann, J, Valand, T, Abel, ML and Watts, JF (2006) Probing the electronic structure of Ni-X, (X = B, S, P) catalysts with XPS In: 11th European Conference on Applications of Surface and Interface Anlaysis, 2005-09-25 - 2005-09-30, Vienna, AUSTRIA.

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