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Items where Author is "Szajnowski, W"

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Conference or Workshop Item

Santamaria, C, Bober, M, Szajnowski, W and Aso, N (2004) Analysis of remotely-sensed imagery using the level-crossing statistics texture descriptor In: Conference on Image and Signal Processing for Remote Sensing X, 2004-09-13 - 2004-09-15, Maspalomas, SPAIN.

Santamaria, C, Bober, M and Szajnowski, W (2004) Texture analysis using level-crossing statistics In: 17th International Conference on Pattern Recognition (ICPR), 2004-08-23 - 2004-08-26, British Machine Vis Assoc, Cambridge, ENGLAND.

Szajnowski, W., England, Jonathan, Stephens, K., Fotheringham, I., Scargill, D. and Rimini, E. (1995) Measuring a Two Dimensional Profile of an Ion Beam In: Ion Implantation Technology 94 (IIT 94), 13-17 Jun 1994, Catania, Italy.

Patent

UNSPECIFIED Determining statistical descriptors of a signal from a set of its samples 7352321.

UNSPECIFIED Image Analysis and representation .

UNSPECIFIED Method and apparatus for image processing 7440636.

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