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Items where Author is "Ridler, N"

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Number of items: 4.

Article

Votsi, Haris, Li, C, Aaen, Peter H and Ridler, NM (2017) An Active Interferometric Method for Extreme Impedance On-Wafer Device Measurements IEEE Microwave and Wireless Components Letters..

Aaen, PH, Stant, LT and Ridler, NM (2016) Comparing methods for evaluating measurement uncertainty given in the JCGM `Evaluation of Measurement Data' documents Measurement, 94. pp. 847-851.

Stant, Laurence, Aaen, Peter and Ridler, NM (2016) Evaluating Residual Errors in Waveguide Network Analysers from Microwave to Submillimetre-wave Frequencies IET Microwaves, Antennas and Propagation, 11 (3). pp. 324-329.

Conference or Workshop Item

Votsi, Haris, Roch-Jeune, I, Haddadi, K, Li, C, Dambrine, G, Aaen, Peter and Ridler, N (2017) Development of a Reference Wafer for On-Wafer Testing of Extreme Impedance Devices In: 88th ARFTG Microwave Measurement Symposium, 2016-12-06 - 2016-12-09, Austin, Texas.

This list was generated on Sun Sep 24 06:40:11 2017 UTC.

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