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Items where Author is "Ridler, N"

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Stant, Laurence T., Salter, Martin J., Ridler, Nick M., Williams, Dylan F. and Aaen, Peter H. (2018) Propagating Measurement Uncertainty to Microwave Amplifier Nonlinear Behavioral Models IEEE Transactions on Microwave Theory and Techniques.

Votsi, Haris, Li, C, Aaen, Peter H and Ridler, NM (2017) An Active Interferometric Method for Extreme Impedance On-Wafer Device Measurements IEEE Microwave and Wireless Components Letters., 27 (11). pp. 1034-1036.

Stant, Laurence, Aaen, Peter and Ridler, N (2016) Comparing methods for evaluating measurement uncertainty given in the JCGM `Evaluation of Measurement Data' documents Measurement, 94. pp. 847-851.

Stant, Laurence, Aaen, Peter and Ridler, NM (2016) Evaluating Residual Errors in Waveguide Network Analysers from Microwave to Submillimetre-wave Frequencies IET Microwaves, Antennas and Propagation, 11 (3). pp. 324-329.

Conference or Workshop Item

Votsi, Haris, Roch-Jeune, I, Haddadi, K, Li, C, Dambrine, G, Aaen, Peter and Ridler, N (2017) Development of a Reference Wafer for On-Wafer Testing of Extreme Impedance Devices In: 88th ARFTG Microwave Measurement Symposium, 2016-12-06 - 2016-12-09, Austin, Texas.

This list was generated on Tue Mar 31 03:26:41 2020 UTC.

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