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Items where Author is "Reehal, H"

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Toal, SJ, Reehal, HS, Webb, SJ, Barradas, NP and Jeynes, C (1999) Structural analysis of nanocrystalline SiC thin films grown on silicon by ECR plasma CVD THIN SOLID FILMS, 343. pp. 292-294.

Conference or Workshop Item

Martinez, FL, Ruiz-Merino, R, del Prado, A, San Andres, E, Martil, I, Gonzalez-Diaz, G, Jeynes, C, Barradas, NP, Wang, L and Reehal, HS (2004) Bonding structure and hydrogen content in silicon nitride thin films deposited by the electron cyclotron resonance plasma method In: 8th European Vacuum Congress (EVC-8)/2nd Annual Conference of the German-Vacuum-Society (DVG), 2003-06-23 - 2003-06-26, Berlin, GERMANY.

Toal, SJ, Reehal, HS, Barradas, NP and Jeynes, C (1999) Growth of microcrystalline beta-SiC films on silicon by ECR plasma CVD In: Symposium on Surface Processing - Laser, Lamp, Plasma, at the Annual Spring Meeting of the European-Materials-Society (E-MRS 96), 1996-06-16 - 1998-06-19, STRASBOURG, FRANCE.

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