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Items where Author is "Priolo, F"

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Number of items: 7.

Article

Scapellato, GG, Boninelli, S, Napolitani, E, Bruno, E, Smith, AJ, Mirabella, S, Mastromatteo, M, De Salvador, D, Gwilliam, R, Spinella, C, Carnera, A and Priolo, F (2011) Self-interstitials injection in crystalline Ge induced by GeO2 nanoclusters PHYSICAL REVIEW B, 84 (2), ARTN 0.

Scapellato, GG, Bruno, E, Smith, AJ, Napolitani, E, De Salvador, D, Mirabella, S, Mastromatteo, M, Carnera, A, Gwilliam, R and Priolo, F (2011) Role of self-interstitials on B diffusion in Ge Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms.

Carey, JD, Barklie, RC, Donegan, JF, Priolo, F, Franzo, G and Coffa, S (1999) Electron paramagnetic resonance and photoluminescence study of Er-impurity complexes in Si PHYSICAL REVIEW B, 59 (4). pp. 2773-2782.

Carey, JD, Donegan, JF, Barklie, RC, Priolo, F, Franzo, G and Coffa, S (1996) Electron paramagnetic resonance of erbium doped silicon Applied Physics Letters, 69 (25). pp. 3854-3856.

Carey, JD, Donegan, JF, Barklie, RC, Priolo, F, Franzo, G and Coffa, S (1996) Electron paramagnetic resonance of erbium doped silicon Applied Physics Letters, 69 (25). pp. 3854-3856.

Barklie, R. C., O'Raifeartaigh, C., Nylandsted-Larsen, A., Priolo, F., Lulli, G., Grob, J. J., Mesli, A., Lindner, J. K. N., Cristiano, F. and Hemment, P. L. F. (1996) Ion implantation induced damage in relaxed Si1-xGex Proceedings of the 11th International Conference on Ion Implantation Technology.

Conference or Workshop Item

Carey, JD and Priolo, F (1999) Structure of Er-related centers in Si In: 20th International Conference on Defects in Semiconductors (ICDS-20), 1999-07-26 - 1999-07-30, BERKELEY, CA.

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