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Items where Author is "OCONNOR, M"

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LYNCH, S, MURTAGH, M, CREAN, GM, KELLY, PV, OCONNOR, M and JEYNES, C (1993) NONDESTRUCTIVE DEPTH PROFILING OF SILICON ION-IMPLANTATION INDUCED DAMAGE IN SILICON (100) SUBSTRATES In: 1ST INTERNATIONAL CONF ON SPECTROSCOPIC ELLIPSOMETRY, 1993-01-11 - 1993-01-14, MINIST RECH & ESPACE, PARIS, FRANCE.

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