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Items where Author is "Noakes, T"

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Alzanki, T, Bennett, N, Gwilliam, R, Jeynes, C, Bailey, P, Noakes, T and Sealy, B (2014) Ion Beam Analysis for Hall Scattering Factor Measurements in Antimony Implanted Bulk and Strained Silicon JOURNAL OF ENGINEERING RESEARCH, 2 (1). pp. 121-132.

Alzanki, T, Bennett, N, Gwilliam, R, Jeynes, C, Sealy, B, Bailey, P and Noakes, T (2014) Ion beam analysis for hall scattering factor measurements in antimony implanted bulk and strained silicon Journal of Engineering Research, 2 (1). pp. 122-132.

O'Reilly, L, Horan, K, McNally, PJ, Bennett, NS, Cowern, NEB, Lankinen, A, Sealy, BJ, Gwilliam, RM, Noakes, TCQ and Bailey, P (2008) Constraints on micro-Raman strain metrology for highly doped strained Si materials APPLIED PHYSICS LETTERS, 92 (23), ARTN 2.

Bennett, NS, Cowern, NEB, Smith, AJ, Kah, M, Gwilliam, RM, Sealy, BJ, Noakes, TCQ, Bailey, P, Giubertoni, D and Bersani, M (2008) Differential Hall characterisation of ultrashallow doping in advanced Si-based materials Materials Science and Engineering B: Solid-State Materials for Advanced Technology, 154-15 (1-3). pp. 229-233.

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