Items where Author is "Lu, JR"
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Styrkas, DA, Keddie, JL, Lu, JR, Su, TJ and Zhdan, PA (1999) Structure of self-assembled layers on silicon: Combined use of spectroscopic variable angle ellipsometry, neutron reflection, and atomic force microscopy Journal of Applied Physics, 85 (2). 868 - 875. ISSN 0021-8979