Items where Author is "Knights, AP"
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Coleman, PG, Nash, D, Edwardson, CJ, Knights, AP and Gwilliam, RM (2011) The evolution of vacancy-type defects in silicon-on-insulator structures studied by positron annihilation spectroscopy JOURNAL OF APPLIED PHYSICS, 110 (1). ? - ?. ISSN 0021-8979
Crowe, IF, Halsall, MP, Hulko, O, Knights, AP, Gwilliam, RM, Wojdak, M and Kenyon, AJ (2011) Probing the phonon confinement in ultrasmall silicon nanocrystals reveals a size-dependent surface energy JOURNAL OF APPLIED PHYSICS, 109 (8). ? - ?. ISSN 0021-8979
Smith, AJ, Gwilliam, RM, Stolojan, V, Knights, AP, Coleman, PG, Kallis, A and Yeong, SH (2009) Enhancement of phosphorus activation in vacancy engineered thin silicon-on-insulator substrates J APPL PHYS, 106 (10). ISSN 0021-8979
Wright, NM, Thomson, DJ, Litvinenko, KL, Headley, WR, Smith, AJ, Knights, AP, Deane, JHB, Gardes, FY, Mashanovich, GZ, Gwilliam, R and Reed, GT (2008) Free carrier lifetime modification for silicon waveguide based devices OPT EXPRESS, 16 (24). 19779 - 19784. ISSN 1094-4087
Thomson, D, Gardes, FY, Mashanovich, GZ, Knights, AP and Reed, GT (2008) Using SiO2 carrier confinement in total internal reflection optical switches to restrict carrier diffusion in the guiding layer JOURNAL OF LIGHTWAVE TECHNOLOGY, 26 (9-12). 1288 - 1294. ISSN 0733-8724
Knights, AP, Bulk, MP, Jessop, PE, Waugh, P, Loiacono, R, Mashanovich, GZ, Reed, GT and Gwilliam, RM (2008) Optical filters utilizing ion implanted Bragg gratings in SOI waveguides Advances in Optical Technologies, 2008 . ISSN 1687-6393
Gardes, FY, Reed, GT, Knights, AP, Mashanovich, G, Jessop, PE, Rowe, L, McFaul, S, Bruce, D and Tarr, NG (2008) Sub-micron optical waveguides for silicon photonics formed via the local oxidation of silicon (LOCOS) Proceedings of SPIE - The International Society for Optical Engineering, 6898 . 68980R.1 - 168980R.4.
Gardes, FY, Reed, GT, Knights, AP, Mashanovich, G, Jessop, PE, Rowe, L, McFaul, S, Bruce, D and Tarr, NG (2008) Sub-micron optical waveguides for silicon photonics formed via the Local Oxidation of Silicon (LOCOS) - art. no. 68980R SILICON PHOTONICS III, 6898 . R8980 - R8980. ISSN 0277-786X
