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Items where Author is "Kiss, A"

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Conference or Workshop Item

Gomez-Morilla, I, Simon, A, Simon, R, Williams, CT, Kiss, AZ and Grime, GW (2006) An evaluation of the accuracy and precision of X-ray microanalysis techniques using BCR-126A glass reference material In: 17th International Conference on Ion Beam Analysis, 2005-06-26 - 2005-07-01, Seville, SPAIN.

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