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Jeynes, C and Colaux, JL (2016) Thin film depth profiling by Ion Beam Analysis Analyst, 141. pp. 5944-5985.

Palitsin, Vladimir, Jeynes, JCG, Jeynes, Christopher and Townley, HE (2016) Direct quantification of rare earth doped titania nanoparticles in individual human cells Nanotechnology, 27 (28).

Utgenannt, A, Maspero, Ross, Fortini, Andrea, Turner, R, Florescu, Marian, Jeynes, Christopher, Kanaras, AG, Muskens, OL, Sear, Richard and Keddie, Joseph (2016) Fast Assembly of Gold Nanoparticles in Large-Area 2-D Nanogrids Using a One-Step, Near-Infrared Radiation-Assisted Evaporation Process ACS Nano, 10 (2). pp. 2232-2242.

Secchi, M, Demenev, E, Colaux, JL, Giubertoni, D, Dell'Anna, R, Iacob, E, Gwilliam, M, Jeynes, C and Bersani, M (2015) Development of nanotopography during SIMS characterization of thin films of Ge1-xSnx alloy APPLIED SURFACE SCIENCE, 356. pp. 422-428.

Azarmi, F, Kumar, P, Kumar, P, Mulheron, M, Colaux, JL, Jeynes, C, Adhami, S and Watts, JF (2015) Physicochemical characteristics and occupational exposure to coarse, fine and ultrafine particles during building refurbishment activities Journal of Nanoparticle Research, 17 (8).

Colaux, JL, Terwagne, G and Jeynes, C (2015) On the traceably accurate voltage calibration of electrostatic accelerators NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 349. pp. 173-183.

Jeynes, C (2015) Costs of open data PHYSICS WORLD, 28 (4). p. 21.

James, CD, Jeynes, C, Barradas, NP, Clifton, L, Dalgliesh, RM, Smith, RF, Sankey, SW, Hutchings, LR and Thompson, RL (2015) Modifying polyester surfaces with incompatible polymer additives REACTIVE & FUNCTIONAL POLYMERS, 89. pp. 40-48.

Colaux, JL and Jeynes, C (2015) Accurate electronics calibration for particle backscattering spectrometry ANALYTICAL METHODS, 7 (7). pp. 3096-3104.

Colaux, JL, Jeynes, C, Heasman, KC and Gwilliam, RM (2015) Certified ion implantation fluence by high accuracy RBS ANALYST, 140 (9). pp. 3251-3261.

Fedorenko, YG, Hughes, MA, Colaux, JL, Jeynes, C, Gwilliam, RM, Homewood, K, Gholipour, B, Yao, J, Hewak, DW, Lee, T-H, Elliott, SR and Curry, RJ (2014) Electrical properties of Bi-implanted amorphous chalcogenide films

Jeynes, C (2014) Double-blind bind PHYSICS WORLD, 27 (7). p. 20.

Paneta, V, Colaux, JL, Gurbich, AF, Jeynes, C and Kokkoris, M (2014) Benchmarking experiments for the proton backscattering on Na-23, P-31 and S-nat up to 3.5 MeV NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 328. pp. 1-7.

Gurbich, AF and Jeynes, C (2014) Evaluation of Non-Rutherford Alpha Elastic Scattering Cross-sections for Silicon NUCLEAR DATA SHEETS, 119. pp. 270-272.

Alzanki, T, Bennett, N, Gwilliam, R, Jeynes, C, Bailey, P, Noakes, T and Sealy, B (2014) Ion Beam Analysis for Hall Scattering Factor Measurements in Antimony Implanted Bulk and Strained Silicon JOURNAL OF ENGINEERING RESEARCH, 2 (1). pp. 121-132.

Buis, C, Gros D'Aillon, E, Verger, L, Lohstroh, A, Marrakchi, G and Jeynes, C (2014) Effects of dislocation walls on charge carrier transport properties in CdTe single crystal Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 735. pp. 188-192.

Colaux, JL and Jeynes, C (2014) High accuracy traceable Rutherford backscattering spectrometry of ion implanted samples ANALYTICAL METHODS, 6 (1). pp. 120-129.

Alzanki, T, Bennett, N, Gwilliam, R, Jeynes, C, Sealy, B, Bailey, P and Noakes, T (2014) Ion beam analysis for hall scattering factor measurements in antimony implanted bulk and strained silicon Journal of Engineering Research, 2 (1). pp. 122-132.

Howard, KT, Berhanu, D, Cressey, G, Howard, LE, Bailey, MJ, Bland, PA, Jeynes, C, Matthewman, R, Martins, Z, Sephton, MA, Stolojan, V and Verchovsky, S (2013) Biomass preservation in impact melt ejecta Nature Geoscience, 6 (12). pp. 1018-1022.

Jeynes, JCG, Jeynes, C, Merchant, MJ and Kirkby, KJ (2013) Measuring and modelling cell-to-cell variation in uptake of gold nanoparticles RSC Analyst (138). pp. 7070-7074.

Jeynes, JCG, Jeynes, C, Merchant, MJ and Kirkby, KJ (2013) Measuring and modelling cell-to-cell variation in uptake of gold nanoparticles Analyst (138). pp. 7070-7074.

Romolo, FS, Christopher, ME, Jeynes, C, Webb, RP, Kirkby, KJ, Donghi, M, Ripani, L, Ward, NI and Bailey, MJ (2013) Integrated Ion Beam Analysis (IBA) in Gunshot Residue (GSR) characterisation Forensic Science International, 231 (1-3). pp. 219-228.

Guan, W, Ghatak, J, Peng, Y, Bhatta, UM, Inkson, BJ, Möbus, G, Peng, N, Jeynes, C and Ross, IM (2013) Fabrication and characterisation of embedded metal nanostructures by ion implantation with nanoporous anodic alumina masks Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 307. pp. 273-276.

Christopher, ME, Warmenhoeven, JW, Romolo, FS, Donghi, M, Webb, RP, Jeynes, C, Ward, NI, Kirkby, KJ and Bailey, MJ (2013) A new quantitative method for gunshot residue analysis by ion beam analysis. Analyst. pp. 4649-4655.

Milosavljević, M, Obradović, M, Grce, A, Peruško, D, Pjević, D, Kovač, J, Dražič, G and Jeynes, C (2013) High dose ion irradiation effects on immiscible AlN/TiN nano-scaled multilayers Thin Solid Films.

Wakeling, BR, Degamber, B, Kister, G, Lane, DW, Bailey, Melanie and Jeynes, Christopher (2012) In situ analysis of cadmium sulphide chemical bath deposition by an optical fibre monitor Thin Solid Films, 525. pp. 1-5.

Ohe, T, Zou, B, Morris, PM, Wogelius, RA, Noshita, K, Gomez-Morilla, I and Jeynes, C (2012) Adsorption and diffusion of strontium in simulated rock fractures quantified via ion beam analysis Mineralogical Magazine, 76 (8). pp. 3203-3215.

Berhanuddin, DD, Lourenco, MA, Jeynes, C, Milosavljevic, M, Gwilliam, RM and Homewood, KP (2012) Structural analysis of silicon co-implanted with carbon and high energy proton for the formation of the lasing G-centre JOURNAL OF APPLIED PHYSICS, 112 (10), ARTN 1.

Jeynes, C, Bailey, MJ, Bright, NJ, Christopher, ME, Grime, GW, Jones, BN, Palitsin, VV and Webb, RP (2012) "total IBA" - Where are we? Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 271. pp. 107-118.

Shtereva, KS, Novotny, I, Tvarozek, V, Vojs, M, Flickyngerova, S, Sutta, P, Vincze, A, Milosavljević, M, Jeynes, C and Peng, N (2012) Carrier Control in Polycrystalline ZnO:Ga Thin Films via Nitrogen Implantation Electronic Materials and Processing ECS Journal of Solid State Science and Technology, 1 (5). pp. 237-240.

Jeynes, C, Barradas, NP and Szilágyi, E (2012) Accurate Determination of Quantity of Material in Thin Films by Rutherford Backscattering Spectrometry Analytical Chemistry, 84. pp. 6061-6069.

Antwis, L, Gwilliam, R, Smith, A, Jeynes, C and Homewood, K (2012) Characterization of a-FeSi /c-Si heterojunctions for photovoltaic applications Semiconductor Science and Technology, 27 (3).

Guan, W, Ghatak, J, Peng, Y, Peng, N, Jeynes, C, Inkson, B and Moebus, G (2012) Patterned ion beam implantation of Co ions into a SiO2 thin film via ordered nanoporous alumina masks NANOTECHNOLOGY, 23 (4), ARTN 0.

Milosavljevic, M, Stojanovic, N, Perusko, D, Timotijevic, B, Toprek, D, Kovac, J, Drazic, G and Jeynes, C (2012) Ion irradiation induced Al-Ti interaction in nano-scaled Al/Ti multilayers APPLIED SURFACE SCIENCE, 258 (6). pp. 2043-2046.

Wakeling, BR, Degamber, B, Kister, G, Lane, DW, Bailey, MJ and Jeynes, C (2012) In situ analysis of cadmium sulphide chemical bath deposition by an optical fibre monitor Thin Solid Films, 525. pp. 1-5.

Giubertoni, D, Demenev, E, Jestin, Y, Meirer, F, Gennaro, S, Iacob, E, Pepponi, G, Pucker, G, Bersani, M, Gupta, S, Saraswat, KC, Gwilliam, RM, Jeynes, C and Colaux, JL (2012) Solid phase epitaxial re-growth of Sn ion implanted germanium thin films AIP Conference Proceedings, 1496. pp. 103-106.

Jeynes, C, Webb, RP and Lohstroh, A (2011) Ion Beam Analysis: A Century of Exploiting the Electronic and Nuclear Structure of the Atom for Materials Characterisation Reviews of Accelerator Science and Technology, 4. pp. 41-82.

Gilbert, M, Davoisne, C, Stennett, MC, Hyatt, NC, Peng, N, Jeynes, C and Lee, WE (2011) Krypton and helium irradiation damage in yttria-stabilised zirconia Materials Research Society Symposium Proceedings, 1298. pp. 197-202.

Abriola, D, Barradas, NP, Bogdanović-Radović, I, Chiari, M, Gurbich, AF, Jeynes, C, Kokkoris, M, Mayer, M, Ramos, AR, Shi, L and Vickridge, I (2011) Development of a reference database for Ion Beam Analysis and future perspectives Nuclear Instruments and Methods in Physics Research B, 269 (24). pp. 2972-2978.

Kaabar, W, Daar, E, Bunk, O, Farquharson, MJ, Laklouk, A, Bailey, M, Jeynes, C, Gundogdu, O and Bradley, DA (2011) Elemental and structural studies at the bonecartilage interface Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 652 (1). pp. 786-790.

Khamsuwan, J, Intarasiri, S, Kirkby, K, Jeynes, C, Chu, PK, Kamwanna, T and Yu, LD (2011) High-energy heavy ion beam annealing effect on ion beam synthesis of silicon carbide Surface and Coatings Technology, 206 (5). pp. 770-774.

Gilbert, M, Davoisne, C, Stennett, M, Hyatt, N, Peng, N, Jeynes, C and Lee, WE (2011) Krypton and helium irradiation damage in neodymium-zirconolite Journal of Nuclear Materials, 416 (1-2). pp. 221-224.

Davoisne, C, Stennett, MC, Hyatt, NC, Peng, Nianhua, Jeynes, Christopher and Lee, WE (2011) Krypton irradiation damage in Nd-doped zirconolite and perovskite Journal of Nuclear Materials, 415 (1). pp. 67-73.

Gurbich, AF, Abriola, D, Barradas, NP, Ramos, AR, Bogdanovic-Radovic, I, Chiari, M, Jeynes, C, Kokkoris, M, Mayer, M, Shi, L and Vickridge, I (2011) Measurements and Evaluation of Differential Cross-sections for Ion Beam Analysis JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 59 (2). pp. 2010-2013.

Guan, W, Ghatak, J, Peng, Y, Möbus, G, Peng, N and Jeynes, C (2011) XTEM characterization of modulated ion implantation through self-organized anodic aluminum oxide (AAO) membranes Materials Research Society Symposium Proceedings, 1411. pp. 49-54.

Bradley, DA, Kaabar, W, Gundogdu, O, Farquharson, MJ, Janousch, M, Bailey, M and Jeynes, C (2010) Synchrotron and ion beam studies of the bone-cartilage interface NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 619 (1-3). pp. 330-337.

Olofinjana, B, Egharevba, GO, Eleruja, MA, Jeynes, C, Adedeji, AV, Akinwunmi, OO, Taleatu, BA, Mordi, CU and Ajayi, EOB (2010) Synthesis and Some Properties of Metal Organic Chemical Vapour Deposited Molybdenum Oxysulphide Thin Films J MATER SCI TECHNOL, 26 (6). pp. 552-557.

Milosavljevic, M, Perusko, D, Milinovic, V, Stojanovic, Z, Zalar, A, Kovac, J and Jeynes, C (2010) Ion irradiation stability of multilayered AlN/TiN nanocomposites JOURNAL OF PHYSICS D-APPLIED PHYSICS, 43 (6), ARTN 0.

Kaabar, W, Daar, E, Bunk, O, Farquharson, MJ, Laklouk, A, Bailey, M, Jeynes, C, Gundogdu, O and Bradley, DA (2010) Elemental and structural studies at the bone-cartilage interface Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 652 (1). pp. 786-790.

Loiacono, R, Reed, GT, Gwilliam, R, Mashanovich, GZ, O'Faolain, L, Krauss, T, Lulli, G, Jeynes, C and Jones, R (2010) Germanium implanted Bragg gratings in silicon on insulator waveguides Proceedings of SPIE - The International Society for Optical Engineering, 7606.

Davoisne, C, Lee, WE, Stennett, MC, Hyatt, NC, Peng, N and Jeynes, C (2010) Irradiation effects in ceramics for plutonium disposition Ceramic Transactions, 222. pp. 3-9.

Bailey, MJ, Coe, S, Grant, DM, Grime, GW and Jeynes, C (2009) Accurate determination of the Ca : P ratio in rough hydroxyapatite samples by SEM-EDS, PIXE and RBS - a comparative study X-RAY SPECTROMETRY, 38 (4). pp. 343-347.

Bailey, MJ and Jeynes, C (2009) Characterisation of gunshot residue particles using self-consistent ion beam analysis NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 267 (12-13). pp. 2265-2268.

Bailey, MJ, Howard, KT, Kirkby, KJ and Jeynes, C (2009) Characterisation of inhomogeneous inclusions in Darwin glass using ion beam analysis NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 267 (12-13). pp. 2219-2224.

Peng, N, Jeynes, C, Bailey, MJ, Adikaari, D, Stolojan, V and Webb, RP (2009) High concentration Mn ion implantation in Si NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 267 (8-9). pp. 1623-1625.

Kaabar, W, Daar, E, Gundogdu, O, Jenneson, PM, Farquharson, MJ, Webb, M, Jeynes, C and Bradley, DA (2009) Metal deposition at the bone-cartilage interface in articular cartilage APPLIED RADIATION AND ISOTOPES, 67 (3). pp. 475-479.

Hashim, S, Al-Ahbabi, S, Bradley, DA, Webb, M, Jeynes, C, Ramli, AT and Wagiran, H (2009) The thermoluminescence response of doped SiO2 optical fibres subjected to photon and electron irradiations APPLIED RADIATION AND ISOTOPES, 67 (3). pp. 423-427.

Perusko, D, Milinovic, V, Mitric, M, Petrovic, S, Jeynes, C and Milosavljevic, M (2009) Ion Beam Modification of Al/Ti Multilayers MATERIALS AND MANUFACTURING PROCESSES, 24 (10-11). pp. 1130-1133.

Mordi, CU, Eleruja, MA, Taleatu, BA, Egharevba, GO, Adedeji, AV, Akinwunmi, OO, Olofinjana, B, Jeynes, C and Ajayi, EOB (2009) Metal Organic Chemical Vapour Deposited Thin Films of Cobalt Oxide Prepared via Cobalt Acetylacetonate JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, 25 (1). pp. 85-89.

Molodtsov, SL, Gurbich, AF and Jeynes, C (2008) Accurate ion beam analysis in the presence of surface roughness JOURNAL OF PHYSICS D-APPLIED PHYSICS, 41 (20), ARTN 2.

Slotte, J, Rummukainen, M, Tuomisto, F, Markevich, VP, Peaker, AR, Jeynes, Christopher and Gwilliam, Russell (2008) Evolution of vacancy-related defects upon annealing of ion-implanted germanium PHYSICAL REVIEW B, 78 (8), ARTN 0.

Barradas, NP and Jeynes, C (2008) Advanced physics and algorithms in the IBA DataFurnace NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 266 (8). pp. 1875-1879.

Beck, L, Jeynes, C and Barradas, NP (2008) Characterization of paint layers by simultaneous self-consistent fitting of RBS/PIXE spectra using simulated annealing NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 266 (8). pp. 1871-1874.

Jeynes, JCG, Jeynes, C, Kirkby, KJ, Ruemmeli, A and Silva, SRP (2008) RBS/EBS/PIXE measurement of single-walled carbon nanotube modification by nitric acid purification treatment NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 266 (8). pp. 1569-1573.

Zhao, Q, Liu, Y, Wang, C, Wang, S, Peng, N and Jeynes, C (2008) Reduction of bacterial adhesion on ion-implanted stainless steel surfaces MEDICAL ENGINEERING & PHYSICS, 30 (3). pp. 341-349.

Perusko, D, Webb, MJ, Milinovic, V, Timotijevic, B, Milosavljevic, M, Jeynes, C and Webb, RP (2008) On the ion irradiation stability of Al/Ti versus AlN/TiN multilayers Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 266 (8). pp. 1749-1753.

Gurbich, AF and Jeynes, C (2007) Evaluation of non-Rutherford proton elastic scattering cross-section for magnesium NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 265 (2). pp. 447-452.

Barradas, NP, Arstila, K, Battistig, G, Bianconi, M, Dytlewski, N, Jeynes, C, Kotai, E, Lulli, G, Mayer, M, Rauhala, E, Szilagyi, E and Thompson, M (2007) International Atomic Energy Agency intercomparison of ion beam analysis software NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 262 (2). pp. 281-303.

Zhao, Q, Liu, Y, Wang, C, Wang, S, Peng, N and Jeynes, C (2007) Bacterial adhesion on ion-implanted stainless steel surfaces APPLIED SURFACE SCIENCE, 253 (21). pp. 8674-8681.

Pascual-Izarra, C, Barradas, NP, Reis, MA, Jeynes, C, Menu, M, Lavedrine, B, Jacques Ezrati, J and Roehrs, S (2007) Towards truly simultaneous PIXE and RBS analysis of layered objects in cultural heritage NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 261 (1-2). pp. 426-429.

Eleruja, MA, Egharevba, GO, Abulude, OA, Akinwunmi, OO, Jeynes, C and Ajayi, EOB (2007) Preparation and characterization of metalorganic chemical vapor deposited nickel oxide and lithium nickel oxide thin films JOURNAL OF MATERIALS SCIENCE, 42 (8). pp. 2758-2765.

Peaker, AR, Markevich, VP, Slotte, J, Rummukainen, M, Capan, I, Pivac, B, Gwilliam, R, Jeynes, C and Dobaczewski, L (2006) Understanding ion implantation defects in germanium ECS Transactions, 3 (2). pp. 67-76.

Clough, AS, Collins, SA, Gauntlett, FE, Hodgson, MR, Jeynes, C, Rihawy, MS, Todd, AM and Thompson, RL (2006) In situ water permeation measurement using an external He-3(2+) ion beam JOURNAL OF MEMBRANE SCIENCE, 285 (1-2). pp. 137-143.

Admans, LL, Jeynes, C, Clarke, J and Spyrou, NM (2006) Elemental content of erythrocytes from patients undergoing Coronary Artery Bypass Grafting (CABG) surgery using PIXE analysis JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY, 269 (3). pp. 619-623.

Jeynes, C, Peng, N, Barradas, NP and Gwilliam, RM (2006) Quality assurance in an implantation laboratory by high accuracy RBS NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 249. pp. 482-485.

Webb, M, Jeynes, C, Gwilliam, R, Royle, A and Sealy, B (2006) Characterising ion-cut in GaAs by Rutherford backscattering spectroscopy Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 249 (1-2). pp. 429-431.

Lee, WP, Gundabala, VR, Akpa, BS, Johns, ML, Jeynes, C and Routh, AF (2006) Distribution of surfactants in latex films: A Rutherford backscattering study LANGMUIR, 22 (12). pp. 5314-5320.

Barradas, NP, Alves, E, Jeynes, C and Tosaki, M (2006) Accurate simulation of backscattering spectra in the presence of sharp resonances NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 247 (2). pp. 381-389.

Rickerby, J, Simon, A, Jeynes, C, Morgan, TJ and Steinke, JHG (2006) 1,1,1,5,5,5-Hexafluoroacetylacetonate copper(I) poly(vinylsiloxane)s as precursors for copper direct-write CHEMISTRY OF MATERIALS, 18 (10). pp. 2489-2498.

Analytis, JG, Ardavan, A, Blundell, SJ, Owen, RL, Garman, EF, Jeynes, Christopher and Powell, BJ (2006) Effect of irradiation-induced disorder on the conductivity and critical temperature of the organic superconductor kappa-(BEDT-TTF)(2)Cu(SCN)(2) PHYSICAL REVIEW LETTERS, 96 (17), ARTN 1.

Sealy, BJ, Smith, AJ, Alzanki, T, Bennett, N, Li, L, Jeynes, C, Colombeau, B, Collart, EJH, Emerson, NG, Gwilliam, RM and Cowern, NEB (2006) Shallow junctions in silicon via low thermal budget processing Extended Abstracts of the Sixth International Workshop on Junction Technology, IWJT '06. pp. 10-15.

Webb, M, Jeynes, C, Gwilliam, R, Too, P, Kozanecki, A, Domagala, J, Royle, A and Sealy, B (2005) The influence of the ion implantation temperature and the dose rate on smart-cut (c) in GaAs NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 240 (1-2). pp. 142-145.

Webb, M, Jeynes, C, Gwilliam, RM, Tabatabaian, Z, Royle, A and Sealy, BJ (2005) The influence of the ion implantation temperature and the flux on smart-cut (c) in GaAs NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 237 (1-2). pp. 193-196.

Whelan, S, Kelly, MJ, Gwilliam, R, Jeynes, C and Bongiorno, C (2005) The dependence of the radiation damage formation on the substrate implant temperature in GaN during Mg ion implantation JOURNAL OF APPLIED PHYSICS, 98 (1), ARTN 0.

Ilori, OO, Osasona, O, Eleruja, MA, Egharevba, GO, Adegboyega, GA, Chiodelli, G, Boudreault, G, Jeynes, C and Ajayi, EOB (2005) Preparation and characterization of metallorganic chemical vapour deposited molybdenum (II) oxide (MoO) thin films THIN SOLID FILMS, 472 (1-2). pp. 84-89.

Ilori, OO, Osasona, O, Eleruja, MA, Egharevba, GO, Adegboyega, GA, Chiodelli, G, Boudreault, G, Jeynes, C and Ajayi, EOB (2005) Preparation and characterization of metallorganic chemical vapour deposited LixMoyOz using a single source solid precursor IONICS, 11 (5-6). pp. 387-392.

Barradas, NP, Added, N, Arnoldbik, WM, Bogdanovic-Radovic, I, Bohne, W, Cardoso, S, Danner, C, Dytlewski, N, Freitas, PP, Jaksic, M, Jeynes, C, Krug, C, Lennard, WN, Lindner, S, Linsmeier, C, Medunic, Z, Pelicon, P, Pezzi, RP, Radtke, C, Rohrich, J, Sajavaara, T, Salgado, TDM, Stedile, FC, Tabacniks, MH and Vickridge, I (2005) A round robin characterisation of the thickness and composition of thin to ultra-thin AlNO films NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 227 (3). pp. 397-419.

Dilliway, GDM, Cowern, NEB, Xu, L, McNally, PJ, Jeynes, C, Mendoza, E, Ashburn, P and Bagnall, DM (2004) Influence of H2 preconditioning on the nucleation and growth of self-assembled germanium islands on silicon (001) Materials Research Society Symposium Proceedings, 820. pp. 351-356.

Seah, MP, Spencer, SJ, Bensebaa, F, Vickridge, I, Danzebrink, H, Krumrey, M, Gross, T, Oesterle, W, Wendler, E, Rheinländer, B, Azuma, Y, Kojima, I, Suzuki, N, Suzuki, M, Tanuma, S, Moon, DW, Lee, HJ, Cho, HM, Chen, HY, Wee, ATS, Osipowicz, T, Pan, JS, Jordaan, WA, Hauert, R, Klotz, U, Van Der Marel, C, Verheijen, M, Tamminga, Y, Jeynes, C, Bailey, P, Biswas, S, Falke, U, Nguyen, NV, Chandler-Horowitz, D, Ehrstein, JR, Muller, D and Dura, JA (2004) Critical review of the current status of thickness measurements for ultrathin SiO on Si Part V: Results of a CCQM pilot study Surface and Interface Analysis, 36 (9). pp. 1269-1303.

Boudreault, G, Elliman, RG, Grotzschel, R, Gujrathi, SC, Jeynes, C, Lennard, WN, Rauhala, E, Sajavaara, T, Timmers, H, Wang, YQ and Weijers, TDM (2004) Round Robin: measurement of H implantation distributions in Si by elastic recoil detection NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 222 (3-4). pp. 547-566.

Alzanki, T, Gwilliam, R, Emerson, N, Tabatabaian, Z, Jeynes, C and Sealy, BJ (2004) Concentration profiles of antimony-doped shallow layers in silicon SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 19 (6), PII S0. pp. 728-732.

Simon, A, Jeynes, C, Webb, RP, Finnis, R, Tabatabian, Z, Sellin, PJ, Breese, MBH, Fellows, DF, van den Broek, R and Gwilliam, RM (2004) The new Surrey ion beam analysis facility NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 219. pp. 405-409.

Simpson, TRE, Tabatabaian, Z, Jeynes, C, Parbhoo, B and Keddie, JL (2004) Influence of interfaces on the rates of crosslinking in poly(dimethyl siloxane) coatings JOURNAL OF POLYMER SCIENCE PART A-POLYMER CHEMISTRY, 42 (6). pp. 1421-1431.

Boudreault, G, Claudio, G, Jeynes, C, Low, R and Sealy, BJ (2004) Accurate calibration of the retained fluence from a versatile single wafer implanter using RBS NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 217 (1). pp. 177-182.

Dilliway, GDM, Cowern, NEB, Jeynes, C, O'Reilly, L, McNally, PJ and Bagnall, DM (2003) Structural and compositional evolution of self-assembled germanium islands on silicon (001) during high growth rate LPCVD Materials Research Society Symposium - Proceedings, 775. pp. 275-280.

Aramendia, E, Mallegol, J, Jeynes, C, Barandiaran, MJ, Keddie, JL and Asua, JM (2003) Distribution of surfactants near acrylic latex film surfaces: A comparison of conventional and reactive surfactants (surfmers) LANGMUIR, 19 (8). pp. 3212-3221.

Jeynes, C, Barradas, NP, Marriott, PK, Boudreault, G, Jenkin, M, Wendler, E and Webb, RP (2003) Elemental thin film depth profiles by ion beam analysis using simulated annealing - a new tool JOURNAL OF PHYSICS D-APPLIED PHYSICS, 36 (7), PII S0. R97-R126.

Peng, N, Shao, G, Jeynes, C, Webb, RP, Gwilliam, RM, Boudreault, G, Astill, DM and Liang, WY (2003) Ion beam synthesis of superconducting MgB2 thin films APPLIED PHYSICS LETTERS, 82 (2). pp. 236-238.

Claudio, G, Jeynes, C, Kirkby, KJ, Sealy, BJ, Gwilliam, R, Low, R, Brown, B, Alford, TL, Nastasi, M and Vella, MC (2003) Electrical behaviour of arsenic implanted silicon wafers at large tilt angle IIT2002: ION IMPLANTATION TECHNOLOGY, PROCEEDINGS. pp. 614-617.

Rozenberg, GG, Bresler, E, Speakman, SP, Jeynes, C and Steinke, JHG (2002) Patterned low temperature copper-rich deposits using inkjet printing APPLIED PHYSICS LETTERS, 81 (27). pp. 5249-5251.

Kang, DJ, Peng, NH, Webb, R, Jeynes, C, Yun, JH, Moon, SH, Oh, B, Burnell, G, Tarte, EJ, Moore, DF and Blamire, MG (2002) Realization and properties of MgB2 metal-masked ion damage junctions APPLIED PHYSICS LETTERS, 81 (19). pp. 3600-3602.

Too, P, Ahmed, S, Jeynes, C, Sealy, BJ and Gwilliam, R (2002) Electrical isolation of n-type InP using MeV iron implantation at different doses and substrate temperatures ELECTRONICS LETTERS, 38 (20). pp. 1225-1226.

Eleruja, MA, Adedeji, AV, Egharevba, GO, Lambi, JN, Akanni, MS, Jeynes, C and Ajayi, EOB (2002) Preparation and characterization of undoped zinc oxide and uranium doped zinc oxide thin films OPTICAL MATERIALS, 20 (2), PII S0925-. pp. 119-123.

Barradas, NP, Jeynes, C, Webb, RP and Wendler, E (2002) Accurate determination of the stopping power of He-4 in Si using Bayesian inference NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 194 (1), PII S0168-. pp. 15-25.

Boudreault, G, Jeynes, C, Wendler, E, Nejim, A, Webb, RP and Watjen, U (2002) Accurate RBS measurement of ion implant doses in a silicon SURFACE AND INTERFACE ANALYSIS, 33 (6). pp. 478-486.

Mallegol, J, Gorce, JP, Dupont, O, Jeynes, C, McDonald, PJ and Keddie, JL (2002) Origins and effects of a surfactant excess near the surface of waterborne acrylic pressure-sensitive adhesives LANGMUIR, 18 (11). pp. 4478-4487.

Gurbich, AF, Barradas, NP, Jeynes, C and Wendler, E (2002) Applying elastic backscattering spectrometry when the nuclear excitation function has a fine structure NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 190, PII S0168-. pp. 237-240.

Jeynes, C, Rozenberg, GG, Speakman, SP and Steinke, JHG (2002) A microbeam RBS analysis of low temperature direct-write inkjet deposited copper NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 188, PII S0168-. pp. 141-145.

Kang, DJ, Burnell, G, Lloyd, SJ, Speaks, RS, Peng, NH, Jeynes, C, Webb, R, Yun, JH, Moon, SH, Oh, B, Tarte, EJ, Moore, DF and Blamire, MG (2002) Realization and properties of YBa2Cu3O7-delta Josephson junctions by metal masked ion damage technique APPLIED PHYSICS LETTERS, 80 (5). pp. 814-816.

Adedeji, AV, Egharevba, GO, Jeynes, C and Ajayi, EOB (2002) Preparation and characterization of pyrolytically deposited (Co-V-O and Cr-V-O) thin films THIN SOLID FILMS, 402 (1-2). pp. 49-54.

Milosavljevic, M, Shao, G, Bibic, N, McKinty, CN, Jeynes, C and Homewood, KP (2001) Amorphous-iron disilicide: A promising semiconductor APPLIED PHYSICS LETTERS, 79 (10). pp. 1438-1440.

Surkova, T, Patane, A, Eaves, L, Main, PC, Henini, M, Polimeni, A, Knights, AP and Jeynes, C (2001) Indium interdiffusion in annealed and implanted InAs/(AlGa)As self-assembled quantum dots JOURNAL OF APPLIED PHYSICS, 89 (11). pp. 6044-6047.

Vieira, A, Barradas, NP and Jeynes, C (2001) Error performance analysis of artificial neural networks applied to Rutherford backscattering SURFACE AND INTERFACE ANALYSIS, 31 (1). pp. 35-38.

Ross, GJ, Barradas, NP, Hill, MP, Jeynes, C, Morrissey, P and Watts, JF (2001) Rutherford backscattering spectrometry and computer simulation for the in-depth analysis of chemically modified poly(vinylidene fluoride) JOURNAL OF MATERIALS SCIENCE, 36 (19). pp. 4731-4738.

Jeynes, C, Barradas, NP, Rafla-Yuan, H, Hichwa, BP and Close, R (2000) Accurate depth profiling of complex optical coatings SURFACE AND INTERFACE ANALYSIS, 30 (1). pp. 237-242.

Kahlmann, F, Booij, WE, Blamire, MG, McBrien, PF, Tarte, EJ, Peng, NH, Jeynes, C, Romans, EJ and Pegrum, CM (2000) Transfer function and noise properties of YBa2Cu3O7-delta direct-current superconducting-quantum-interference-device magnetometers with resistively shunted inductances APPLIED PHYSICS LETTERS, 77 (4). pp. 567-569.

Emerson, NG, Gwilliam, RM, Shannon, JM, Jeynes, C, Sealy, BJ, Tsvetkova, T, Tzenov, N, Tzolov, M and Dimova-Malinovska, D (2000) Electrical and optical properties of Co+ ion implanted a-Si1-xCx : H alloys NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 160 (4). pp. 505-509.

Jeynes, C, Barradas, NP, Wilde, JR and Greer, AL (2000) Composition of Ni-Ta-C thick films using simulated annealing analysis of elastic backscattering spectrometry data NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 161. pp. 287-292.

Milosavljevic, M, Bibic, N, Perusko, D, Jeynes, C and Bangert, U (2000) The effects of implanted arsenic on Ti-silicide formation SOLID STATE PHENOMENA, 71. pp. 147-171.

Nejim, A, Gwilliam, RM, Emerson, NG, Knights, AP, Cristiano, F, Barradas, NP and Jeynes, C (1999) Electrical behaviour associated with defect tails in germanium implanted silicon Proceedings of the International Conference on Ion Implantation Technology, 1. pp. 506-509.

Nejim, A, Jeynes, C, Zhao, Q and Muller-Steinhagen, H (1999) Ion implantation of stainless steel heater alloys for anti-fouling applications Proceedings of the International Conference on Ion Implantation Technology, 2. pp. 869-872.

Tzitzinou, A, Keddie, JL, Jeynes, C, Mulder, M, Geurts, J, Treacher, KE, Satguru, R and Zhdan, P (1999) Molecular weight effects on film formation of latex and surfactant morphology. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 218. U609-U609.

Barradas, NP, Jeynes, C, Jenkin, M and Marriott, PK (1999) Bayesian error analysis of Rutherford backscattering spectra THIN SOLID FILMS, 343. pp. 31-34.

Toal, SJ, Reehal, HS, Webb, SJ, Barradas, NP and Jeynes, C (1999) Structural analysis of nanocrystalline SiC thin films grown on silicon by ECR plasma CVD THIN SOLID FILMS, 343. pp. 292-294.

Barradas, NP, Knights, AP, Jeynes, C, Mironov, OA, Grasby, TJ and Parker, EHC (1999) High-depth-resolution Rutherford backscattering data and error analysis of SiGe systems using the simulated annealing and Markov chain Monte Carlo algorithms PHYSICAL REVIEW B, 59 (7). pp. 5097-5105.

Simonsen, AC, Pohler, JP, Jeynes, C and Tougaard, S (1999) Quantification of Au deposited on Ni: XPS peak shape analysis compared to RES SURFACE AND INTERFACE ANALYSIS, 27 (1). pp. 52-56.

Barradas, NP, Almeida, SA, Jeynes, C, Knights, AP, Silva, SRP and Sealy, BJ (1999) RBS and ERDA study of ion beam synthesised amorphous gallium nitride NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 148 (1-4). pp. 463-467.

Barradas, NP, Jeynes, C, Webb, RP, Kreissig, U and Grotzschel, R (1999) Unambiguous automatic evaluation of multiple Ion Beam Analysis data with Simulated Annealing NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 149 (1-2). pp. 233-237.

Kozanecki, A, Stepikhova, M, Lanzerstorfer, S, Jantsch, W, Palmetshofer, L, Sealy, BJ and Jeynes, C (1998) Excitation of Er3+ ions in silicon dioxide films thermally grown on silicon APPLIED PHYSICS LETTERS, 73 (20). pp. 2929-2931.

Barradas, NP, Jeynes, C, Mironov, OA, Phillips, PJ and Parker, EHC (1998) High depth resolution Rutherford backscattering analysis of Si-Si0.78Ge0.22/(0 0 1)Si superlattices NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 139 (1-4). pp. 239-243.

Nejim, A, Knights, AP, Jeynes, C, Coleman, PG and Patel, CJ (1998) Profile broadening of high dose germanium implants into (100) silicon at elevated temperatures due to channeling JOURNAL OF APPLIED PHYSICS, 83 (7). pp. 3565-3573.

Barradas, NP, Jeynes, C, Homewood, KP, Sealy, BJ and Milosavljevic, M (1998) RBS/simulated annealing analysis of silicide formation in Fe/Si systems NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 139 (1-4). pp. 235-238.

Barradas, NP, Jeynes, C and Jackson, SM (1998) RBS/simulated annealing analysis of buried SiCOx layers formed by implantation of O into cubic silicon carbide NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 136. pp. 1168-1171.

Barradas, NP, Jeynes, C and Harry, MA (1998) RBS/simulated annealing analysis of iron-cobalt silicides NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 136. pp. 1163-1167.

Jenneson, PM, Clough, AS, Hollands, R, Mulheron, MJ and Jeynes, C (1998) Profiling chlorine diffusion into ordinary Portland cement and pulverized fuel ash pastes using scanning MeV proton micro-PIXE Journal of Materials Science Letters, 17. pp. 1173-1175.

Barradas, NP, Jeynes, C and Webb, RP (1997) Simulated annealing analysis of Rutherford backscattering data APPLIED PHYSICS LETTERS, 71 (2). pp. 291-293.

Jeynes, C, Jafri, ZH, Webb, RP, Kimber, AC and Ashwin, MJ (1997) Accurate RBS measurements of the indium content of InGaAs thin films SURFACE AND INTERFACE ANALYSIS, 25 (4). pp. 254-260.

Osasona, O, Djebah, A, Ojo, IAO, Eleruja, MA, Adedeji, AV, Jeynes, C and Ajayi, EOB (1997) Preparation and characterization of MOCVD thin films of zinc sulphide OPTICAL MATERIALS, 7 (3). pp. 109-115.

Ashwin, MJ, Pritchard, RE, Newman, RC, Joyce, TB, Bullough, TJ, Wagner, J, Jeynes, C, Breuer, SJ, Jones, R, Briddon, PR and Oberg, S (1996) The bonding of C-As acceptors in InxGa1-xAs grown by chemical beam epitaxy using carbon tetrabromide as the source of carbon JOURNAL OF APPLIED PHYSICS, 80 (12). pp. 6754-6760.

Li, YP, Kilner, JA, Thomas, J, Lacey, D, Cohen, LF, Caplin, AD, Li, YH, Saba, FM, Quincey, PG, Somekh, RE, Jeynes, C and Jafri, ZH (1996) Characterization of YBa2Cu3O7-delta thin films deposited by dc magnetron sputtering JOURNAL OF MATERIALS SCIENCE, 31 (23). pp. 6137-6144.

Jeynes, C, Puttick, KE, Whitmore, LC, Gartner, K, Gee, AE, Millen, DK, Webb, RP, Peel, RMA and Sealy, BJ (1996) Laterally resolved crystalline damage in single-point-diamond-turned silicon NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 118 (1-4). pp. 431-436.

Yousif, KM, Smith, BE and Jeynes, C (1996) Investigation of microstructure of molybdenum-copper black electrodeposited coatings with reference to solar selectivity JOURNAL OF MATERIALS SCIENCE, 31 (1). pp. 185-191.

Ajayi, OB, Osuntola, OK, Ojo, IA and Jeynes, C (1994) Preparation and characterization of MOCVD thin films of cadmium sulphide Thin Solid Films, 248 (1). pp. 57-62.

Murtagh, M, Beechinor, JT, Herbert, PAF, Kelly, PV, Crean, GM and Jeynes, C (1994) Photoreflectance characterization of reactive ion etched silicon Materials Research Society Symposium Proceedings, 324. pp. 167-173.

Altrip, JL, Evans, AGR, Logan, JR and Jeynes, C (1990) Towards the limit of ion implantation and rapid thermal annealing as a technique for shallow junction formation European Solid-State Device Research Conference. pp. 221-224.

Crean, GM, Jeynes, C, Somekh, MG and Webb, RP (1989) Characterization of shallow junction ion implantation profiles: Correlation between a noncontact photodisplacement thermal wave technique and rutherford backscattering analysis European Solid-State Device Research Conference. pp. 929-932.

Kimber, AC and Jeynes, C (1987) APPLICATION OF THE TRUNCATED TWO-PIECE NORMAL DISTRIBUTION TO THE MEASUREMENT OF DEPTHS OF ARSENIC IMPLANTS IN SILICON. Journal of the Royal Statistical Society. Series C: Applied Statistics, 36 (3). pp. 352-357.

Book Section

Jeynes, Christopher and Thompson, RL (2014) Thin Film Depth Profiling In: Ion Beam Analysis: Fundamentals & Applications. Taylor & Francis, Boca Raton, Florida, pp. 197-220. ISBN 978-1439846384

Jeynes, C and Grime, GW (2012) Atomic Excitation Exploited by Energetic-Beam Characterization Methods In: Characterization of Materials. Characterization of Materials, Vol.1: . Wiley, pp. 74-90. ISBN 9780471266969

Jeynes, C (2012) Elastic Backscattering of Ions for Compositional Analysis In: Characterization of Materials. Characterization of Materials, Vol.3: (12(iv)). Wiley, pp. 1972-1993. ISBN 9780471266969

Jeynes, C (2012) Ion Beam Methods – Introduction In: Characterization of Materials. Characterization of Materials, Vol.3: . Wiley, pp. 1941-1948. ISBN 9780471266969

Jeynes, C (2012) "Total" Ion Beam Analysis – 3D imaging of complex samples using MeV ion beams In: Characterization of Materials. Characterization of Materials, Vol.3: (12(ii)). Wiley, pp. 1948-1959. ISBN 9780471266969

Jeynes, C and Barradas, NP (2009) Pitfalls in Ion Beam Analysis In: Handbook of Modern Ion Beam Materials Analysis. Materials Research Society, Warrendale Pennsylvania, pp. 347-383. ISBN 1605112151

Conference or Workshop Item

Peng, N, Jeynes, C, Gwilliam, RM, Webb, RP, Pan, F and Chen, X (2012) On fabrication of high concentration Mn doped Si by ion implantation: problem and challenge In: 18th International Vacuum Congress (IVC)/International Conference on Nanoscience and Technology (ICNT)/14th International Conference on Surfaces Science (ICSS)/Vacuum and Surface Sciences Conference of Asia and Australia (VASSCAA), 2010-08-23 - 2010-08-27, Beijing, PEOPLES R CHINA.

Razali, MA, Smith, AJ, Jeynes, C and Gwilliam, RM (2012) Temperature-Dependant Study Of Phosphorus Ion Implantation In Germanium In: 19th International Conference on Ion Implantation Technology (IIT), 2012-06-25 - 2012-06-29, Valladolid, SPAIN.

Jeynes, JCG, Bailey, MJ, Coley, H, Kirkby, KJ and Jeynes, C (2010) Microbeam PIXE analysis of platinum resistant and sensitive ovarian cancer cells

Bailey, MJ, Jeynes, C, Sealy, BJ, Webb, RP and Gwilliam, RM (2010) On artefacts in the secondary ion mass spectrometry profiling of high fluence H+ implants in GaAs In: 19th International Conference on Ion Beam Analysis, 2009-09-07 - 2009-09-11, Univ Cambridge, Cambridge, ENGLAND.

Webb, R, Bailey, M, Jeynes, C and Grime, G (2010) 19th International Conference on Ion Beam Analysis

Antwis, L, Wong, L, Smith, A, Homewood, K, Jeynes, C and Gwilliam, R (2010) Optimization and characterisation of amorphous iron disilicide formed by ion beam mixing of Fe/Si multilayer structures for photovoltaic applications In: Ion Implantation Technology 2101: 18th International Conference on Ion Implantation Technology IIT 2010, 2010-06-06 - 2010-06-11, Kyoto, Japan.

Bailey, MJ, Kirkby, KJ and Jeynes, C (2009) Trace element profiling of gunshot residues by PIXE and SEM-EDS: a feasibility study In: 13th European X-Ray Spectrometry Conference (EXRS 2008), 2008-06-16 - 2008-06-20, Cavtat, CROATIA.

Stennett, MC, Hyatt, NC, Reid, DP, Maddrell, ER, Peng, N, Jeynes, C, Kirkby, KJ and Woicik, JC (2009) Characterisation of Ion Beam Irradiated Zirconolite for Pu Disposition In: 32nd Symposium on Scientific Basis for Nuclear Waste Management held at the 2008 MRS Fall Meeting, 2008-12-01 - 2008-12-05, Boston, MA.

Jeynes, C, Zoppi, G, Forbes, I, Bailey, MJ and Peng, N (2009) Characterisation of thin film chalcogenide PV materials using MeV ion beam analysis In: International Conference on Sustainable Power Generation and Supply, 2009-04-06 - 2009-04-07, Nanjing, PEOPLES R CHINA.

Stennett, MC, Hyatt, NC, Reid, DP, Maddrell, ER, Peng, N, Jeynes, C, Kirkby, KJ, Woicik, JC and Ravel, B (2009) Heavy ion implantation combined with grazing incidence X-ray absorption spectroscopy (GIXAS): A new methodology for the characterisation of radiation damage in nuclear ceramics In: MRS Spring Meeting 2009: Scientific Basis for Nuclear Waste Management XXXIII, 2009-04-13 - 2009-04-17, San Francisco, USA.

Milosavljević, M, Peruško, D, Milinović, V, Timotijević, B, Zalar, A, Kovač, J and Jeynes, C (2009) High ion irradiation tolerance of multilayered AlN/TiN nanocomposites In: International Topical Meeting on Nuclear Research Applications and Utilization of Accelerators, 2009-05-04 - 2009-05-08, Vienna, Austria.

Perusko, D, Milosavljevic, M, Milinovic, V, Timotijevic, B, Zalar, A, Kovac, J, Pracek, B and Jeynes, C (2008) High fluence nitrogen implantation in Al/Ti multilayers In: 9th European Conference on Accelerators in Applied Research and Technology, 2007-09-03 - 2007-09-07, Florence, ITALY.

Lazzeri, P, Oehrlein, GS, Stueber, GJ, McGowan, R, Busch, E, Pederzoli, S, Jeynes, C, Bersani, M and Anderle, M (2008) Interactions of photoresist stripping plasmas with nanoporous organo-silicate ultra low dielectric constant dielectrics In: 28th Dry Process Symposium (DPS), 2006-11-29 - 2006-11-30, Nagoya, JAPAN.

Gurbich, A, Bogdanovic-Radovic, I, Chiari, M, Jeynes, C, Kokkoris, M, Ramos, AR, Mayer, M, Rauhala, E, Schwerer, O, Liqun, S and Vickridge, I (2008) Status of the problem of nuclear cross section data for IBA In: 18th International Conference on Ion Beam Analysis, 2007-09-23 - 2007-09-28, Univ Hyderabad, Sch Phys, Hyderabad, INDIA.

Barradas, NP, Arstila, K, Battistig, G, Bianconi, M, Dytlewski, N, Jeynes, C, Kotai, E, Lulli, G, Mayer, M, Rauhala, E, Szilagyi, E and Thompson, M (2008) Summary of "IAEA intercomparison of IBA software" In: 18th International Conference on Ion Beam Analysis, 2007-09-23 - 2007-09-28, Univ Hyderabad, Sch Phys, Hyderabad, INDIA.

Peng, N, Jeynes, C, Gwilliam, RM, Kirkby, KJ and Webb, RP (2007) Depth profile analysis for MgB2 thin films, formed by B implantation in Mg ribbons using energetic ion backscatterings In: 8th International Conference on Materials and Mechanisms of Superconductivity and High Temperature Superconductors, 2006-07-09 - 2006-07-14, Dresden, GERMANY.

Mistry, P, Gomez-Morilla, I, Smith, RC, Thomson, D, Grime, GW, Webb, RP, Gwilliam, R, Jeynes, C, Cansell, A, Merchant, M and Kirkby, KJ (2007) Maskless proton beam writing in gallium arsenide In: 10th International Conference on Nuclear Microprobe Technology and Applications held in Conjunction with the 2nd International Workshop on Proton Beam Writing, 2006-07-09 - 2006-07-14, Singapore, SINGAPORE.

Simon, A, Csako, T, Jeynes, C and Szorenyi, T (2006) High lateral resolution 2D mapping of the B/C ratio in a boron carbide film formed by ferntosecond pulsed laser deposition In: 17th International Conference on Ion Beam Analysis, 2005-06-26 - 2005-07-01, Seville, SPAIN.

Yakovlev, EV, Talalaev, RA, Martin, RW, Jeynes, C, Peng, N, Deatcher, CJ and Watson, IM (2006) Modeling and experimental analysis of InGaN MOVPE in the Aixtron AIX 200/4 RF-S horizontal reactor In: 6th International Conference on Nitride Semiconductors (ICNS-6), 2005-08-28 - 2005-09-02, Bremen, GERMANY.

Mistry, P, Gomez-Morilla, I, Grime, GW, Webb, R, Jeynes, C, Gwilliarn, R, Cansell, A, Merchant, M and Kirkby, KJ (2006) Proton beam lithography at the University of Surrey's Ion Beam Centre In: 14th International Conference on Ion Beam Modification of Materials (IBMM 2004), 2004-09-05 - 2004-09-10, Pacific Grove, CA.

Sharp, JA, Gwilliam, RM, Sealy, BJ, Jeynes, C, Hamilton, JJ and Kirkby, KJ (2005) Evaluation of BBr2+ and B++Br+ implants in silicon In: Symposium on Materials Science and Device Issues for Futrue Si-Based Technologies held at the 2005 EMRS Meeting, 2005-05-31 - 2005-06-03, Strasbourg, FRANCE.

Sharp, JA, Gwilliam, RM, Sealy, BJ, Jeynes, C, Hamilton, JJ and Kirkby, KJ (2005) Comparison of elemental boron and boron halide implants into silicon In: 15th International Conference on Ion Implantation Technology, 2004-10-25 - 2004-10-27, Taipei, TAIWAN.

Hamilton, JJ, Collart, EJH, Colombeau, B, Jeynes, C, Bersani, M, Giubertoni, D, Sharp, JA, Cowern, NEB and Kirkby, KJ (2005) Electrical activation of solid-phase epitaxially regrown ultra-low energy boron implants in Ge preamorphised silicon and SOI In: 15th International Conference on Ion Implantation Technology, 2004-10-25 - 2004-10-27, Taipei, TAIWAN.

Xu, L, McNally, PJ, Dilliway, GDM, Cowern, NEB, Jeynes, C, Mendoza, E, Ashburn, P and Bagnall, DM (2005) Raman study of the strain and H-2 preconditioning effect on self-assembled Ge island on Si (001) In: 5th International Conference on Materials for Microelectronics and Nanoengineering, 2004-09-13 - 2004-09-14, Univ Southampton, Southampton, ENGLAND.

Peng, NH, Jeynes, C, Gwilliam, RM, Kirkby, KJ, Webb, RP, Shao, GS, Astill, DA and Liang, WY (2005) A potential integrated low temperature approach for superconducting MgB2 thin film growth and electronics device fabrication by ion implantation In: 2004 Applied Superconductivity Conference, 2004-10-03 - 2004-10-08, Jacksonville, FL.

Merchant, MJ, Mistry, P, Browton, M, Clough, AS, Gauntlett, FE, Jeynes, C, Kirkby, KJ and Grime, GW (2005) Characterisation of the University of Surrey Ion Beam Centre in-air scanning microbeam In: 9th International Conference on Nuclear Microprobe Technology and Applications, 2004-09-13 - 2004-09-17, Cavtat, CROATIA.

Mistry, P, Gornez-Morilla, I, Grime, GW, Webb, R, Jeynes, C, Gwilliam, R, Cansell, A, Merchant, M and Kirkby, KJ (2005) New developments on the Surrey microbeam applications to lithography In: 9th International Conference on Nuclear Microprobe Technology and Applications, 2004-09-13 - 2004-09-17, Cavtat, CROATIA.

Martinez, FL, Ruiz-Merino, R, del Prado, A, San Andres, E, Martil, I, Gonzalez-Diaz, G, Jeynes, C, Barradas, NP, Wang, L and Reehal, HS (2004) Bonding structure and hydrogen content in silicon nitride thin films deposited by the electron cyclotron resonance plasma method In: 8th European Vacuum Congress (EVC-8)/2nd Annual Conference of the German-Vacuum-Society (DVG), 2003-06-23 - 2003-06-26, Berlin, GERMANY.

Chakalov, RA, Jeynes, C, Mikheenko, P, Allsworth, MD, Darlington, CNW, Colclough, MS and Muirhead, CM (2004) Difference in individual layer properties in cuprate/manganite structures deposited by laser ablation In: 10th International Workshop on Oxide Electronics, 2003-09-11 - 2003-09-13, AUGSBAURG, GERMANY.

Peng, NH, Kang, DJ, Jeynes, C, Webb, RP, Moore, DF, Blamire, MG and Chakarov, IR (2003) High quality YBa2Cu3O7-delta Josephson junctions and junction arrays fabricated by masked proton beam irradiation damage In: Applied Superconductivity Conference, 2002-08-04 - 2002-08-09, HOUSTON, TEXAS.

Kang, DJ, Peng, NH, Jeynes, C, Webb, R, Lee, HN, Oh, B, Moon, SH, Burnell, G, Stelmashenko, NA, Tarte, EJ, Moore, DF and Blamire, MG (2003) Josephson effects in MgB2 metal masked ion damage junctions In: Applied Superconductivity Conference, 2002-08-04 - 2002-08-09, HOUSTON, TEXAS.

Dilliway, GDM, Bagnall, DM, Cowern, NEB and Jeynes, C (2003) Self-assembled germanium islands grown on (001) silicon substrates by low-pressure chemical vapor deposition In: 4th International Conference on Materials for Microelectronics and Nanoengineering, 2002-06-10 - 2002-06-12, ESPOO, FINLAND.

Webb, RP, Winston, SH, Gwilliam, RM, Sealy, BJ, Boudreault, G, Jeynes, C and Kirkby, KJ (2003) Comparison of boron halide, decaborane and B implants in Si from molecular dynamics simulations In: 6th International Conference on Computer Simulation of Radiation Effects in Solids, 2002-06-23 - 2002-06-27, DRESDEN, GERMANY.

Claudio, G, Boudreault, G, Jeynes, C, Sealy, BJ, Low, R, Brown, B, Alford, TL, Nastasi, M and Vella, MC (2003) Absolute dose performance of the SWIFT single wafer ion implanter In: 14th International Conference on Ion Implantation Technology, 2002-09-18 - 2002-09-27, TAOS, NM.

Zurrug, H, Mefo, J, Sealy, B, Boudreault, G, Jeynes, C, Webb, RP, Kirkby, KJ, Collart, EJH, Brown, B, Alford, TL, Nastasi, M and Vella, MC (2003) Characterization and enviromental impact of plasma products within an ion implanter In: 14th International Conference on Ion Implantation Technology, 2002-09-18 - 2002-09-27, TAOS, NM.

Gennaro, S, Sealy, BJ, Jeynes, C, Gwilliam, R, Collart, EJH and Licciardello, A (2003) Effects of carbon content and annealing conditions on the electrical activation of indium implanted silicon In: 14th International Conference on Ion Implantation Technology, 2002-09-18 - 2002-09-27, TAOS, NM.

Mefo, J, Kirkby, KJ, Sealy, BJ, Boudreault, G, Jeynes, C and Collart, EJH (2003) Elemental analysis of residual deposits in an ion implanter using IBA techniques In: 14th International Conference on Ion Implantation Technology, 2002-09-18 - 2002-09-27, TAOS, NM.

Winston, SH, Gwilliam, RM, Sealy, BJ, Boudreault, G, Jeynes, C, Webb, RP and Kirkby, KJ (2003) Evaluation of the Boron activation and depth distribution using BBr2+ implants In: 14th International Conference on Ion Implantation Technology, 2002-09-18 - 2002-09-27, TAOS, NM.

Simon, A, Sellin, P, Lohstroh, A and Jeynes, C (2003) Ion beam indneed charge microscopy imaging of CVD diamond In: Conference on Microscopy of Semiconducting Materials, 2003-03-31 - ?, Univ Cambridge, Cambridge, ENGLAND.

Blamire, MG, Kang, DJ, Burnell, G, Peng, NH, Webb, R, Jeynes, C, Yun, JH, Moon, SH and Oh, B (2002) Masked ion damage and implantation for device fabrication In: 12th International School on Vacuum, Electron and Ion Technologies, 2001-09-17 - 2001-09-21, VARNA, BULGARIA.

Peng, NH, Jeynes, C, Webb, R, Chakarov, I and Blamire, M (2002) Optimisation of masked ion irradiation damage profiles in YBCO thin films by Monte Carlo simulation In: 5th European Conference on Applied Superconductivity (EUCAS 2001), 2001-08-26 - 2001-08-30, TECH UNIV DENMARK, LYNGBY, DENMARK.

Kang, DJ, Peng, NH, Webb, R, Jeynes, C, Burnell, G, Yun, JH, Moon, SH, Oh, B, Tarte, EJ, Moore, DF, Kelly, M and Blamire, MG (2002) Irradiation damage technology for manufacturable Josephson junctions In: 7th European Conference on Accelerators in Applied Research and Technology, 2001-08-21 - 2001-08-24, UNIV SURREY, GUILDFORD, ENGLAND.

Peng, NH, Jeynes, C, Webb, R, Chakarov, I, Kang, DJ, Moore, D and Blamire, M (2002) Monte Carlo simulations of energetic proton beam irradiation damage defect productions in YBCO thin films with Au masks In: 7th European Conference on Accelerators in Applied Research and Technology, 2001-08-21 - 2001-08-24, UNIV SURREY, GUILDFORD, ENGLAND.

Milosavljevic, M, Shao, G, Bibic, N, McKinty, CN, Jeynes, C and Homewood, KP (2002) Synthesis of amorphous FeSi2 by ion beam mixing In: 7th European Conference on Accelerators in Applied Research and Technology, 2001-08-21 - 2001-08-24, UNIV SURREY, GUILDFORD, ENGLAND.

Breese, MBH, de Kerckhove, DG, Jeynes, C, Peel, RMA and Murray, CW (2001) An electrostatic beam rocking system on the Surrey nuclear microprobe In: 7th International Conference on Nuclear Microprobe Technology and Applications, 2000-09-10 - 2000-09-15, BORDEAUX, FRANCE.

Peng, NH, Jeynes, C, Webb, RP, Chakarov, IR and Blamire, MG (2001) Monte Carlo simulations of masked ion beam irradiation damage profiles in YBa2Cu3O7-delta thin films In: E-MRS Spring Meeting on Materials Science with Ion Beams, 2000-05-30 - 2000-06-02, STRASBOURG, FRANCE.

Milosavljevic, M, Shao, G, Gwilliam, RM, Jeynes, C, McKinty, CN and Homewood, KP (2001) Properties of beta-FeSi2 grown by combined ion irradiation and annealing of Fe/Si bilayers In: 12th International Conference on Ion Beam Modification of Materials (IBMM2000), 2000-09-03 - 2000-09-08, CANELA, BRAZIL.

Kang, DJ, Speaks, R, Peng, NH, Webb, R, Jeynes, C, Booij, WE, Tarte, EJ, Moore, DF and Blamire, MG (2001) Nanometer scale masked ion damage barriers in YBa2Cu3O7-delta In: 2000 Applied Superconductivity Conference, 2000-09-17 - 2000-09-22, VIRGINIA BEACH, VIRGINIA.

Kahlmann, F, Booij, WE, Blamire, MG, McBrien, PF, Peng, NH, Jeynes, C, Romans, EJ, Pegrum, CM and Tarte, EJ (2001) Performance of high-T-c dc SQUID magnetometers with resistively shunted inductances compared to "unshunted" devices In: 2000 Applied Superconductivity Conference, 2000-09-17 - 2000-09-22, VIRGINIA BEACH, VIRGINIA.

Peng, NH, Chakarov, I, Jeynes, C, Webb, R, Booij, W, Blamire, M and Kelly, M (2000) 2D Monte Carlo simulation of proton implantation of superconducting YBa2Cu3O7-delta thin films through high aspect ratio Nb masks In: 18th International Conference on Atomic Collisions in Solids (ICACS-18), 1999-08-03 - 1999-08-08, ODENSE, DENMARK.

Peaker, AR, Evans-Freeman, JH, Kan, PYY, Hawkins, ID, Terry, J, Jeynes, C and Rubaldo, L (2000) Vacancy-related defects in ion implanted and electron irradiated silicon In: Symposium F: Process Induced Defects in Semiconductors at the 1999 Spring Meeting of the European-Materials-Research-Society, 1999-06-01 - 1999-06-04, STRASBOURG, FRANCE.

Riley, LS, Hall, S, Harris, J, Fernandez, J, Gallas, B, Evans, AGR, Clarke, JF, Humphrey, J, Murray, RT and Jeynes, C (1999) SiGe nMOSFETs with gate oxide grown by low temperature plasma anodisation In: 11th Biennial Conference on Insulating Films on Semiconductors, 1999-06-16 - 1999-06-19, KLOSTER BANZ, GERMANY.

Taylor, JW, Saleh, AS, Rice-Evans, PC, Knights, AP and Jeynes, C (1999) Depth profiling of defects in nitrogen implanted silicon using a slow positron beam In: 8th International Workshop on Slow-Positron Beam Techniques for Solids and Surfaces (SLOPOS-8), 1998-09-06 - 1998-09-12, CAPE TOWN, SOUTH AFRICA.

Booij, WE, Elwell, CA, Tarte, EJ, McBrien, PF, Kahlmann, F, Moore, DF, Blamire, MG, Peng, NH and Jeynes, C (1999) Electrical properties of electron and ion beam irradiated YBa2Cu3O7-delta In: 1998 Applied Superconductivity Conference, 1998-09-13 - 1998-09-18, PALM DESERT, CALIFORNIA.

Toal, SJ, Reehal, HS, Barradas, NP and Jeynes, C (1999) Growth of microcrystalline beta-SiC films on silicon by ECR plasma CVD In: Symposium on Surface Processing - Laser, Lamp, Plasma, at the Annual Spring Meeting of the European-Materials-Society (E-MRS 96), 1996-06-16 - 1998-06-19, STRASBOURG, FRANCE.

Way, AS, Jeynes, C and Webb, RP (1999) Measurement of lateral stress in argon implanted thin gold films using quartz resonator techniques In: 11th International Conference on Ion Beam Modification of Materials (IBMM98), 1998-08-31 - 1998-09-04, ROYAL TROP INST, AMSTERDAM, NETHERLANDS.

Barradas, NP, Jeynes, C, Kusano, Y, Evetts, JE and Hutchings, IM (1999) RBS/simulated annealing and FTIR characterisation of BCN films deposited by dual cathode magnetron sputtering In: 15th International Conference on the Application of Accelerators in Research and Industry, 1998-11-04 - 1998-11-07, UNIV N TEXAS, DENTON, TX.

Marriott, PK, Jenkin, M, Jeynes, C, Barradas, NP, Webb, RP and Sealy, BJ (1999) Rapid accurate automated analysis of complex ion beam analysis data In: 15th International Conference on the Application of Accelerators in Research and Industry, 1998-11-04 - 1998-11-07, UNIV N TEXAS, DENTON, TX.

Kozanecki, A, Jeynes, C, Barradas, NP, Sealy, BJ and Jantsch, W (1999) The influence of implantation and annealing conditions on optical activity of Er3+ ions in 6H SiC In: 11th International Conference on Ion Beam Modification of Materials (IBMM98), 1998-08-31 - 1998-09-04, ROYAL TROP INST, AMSTERDAM, NETHERLANDS.

Naveed, AT, Huda, MQ, Abd El-Rahman, KF, Hartung, J, Evans-Freeman, JH, Peaker, AR, Houghton, DC, Jeynes, C and Gillin, WP (1998) Erbium in silicon-germanium quantum wells In: Symposium on Light Emission from Silicon - Procress Towards Si-based Optoelectronics at the Spring Meeting of the European-Materials-Research-Society, 1998-06-16 - 1998-06-19, STRASBOURG, FRANCE.

Sealy, B, Gwilliam, R, Shannon, J, Jeynes, C, Angelov, C and Tsvetkova, T (1998) Surface electrical conductivity of Co+-implanted a-SiC : H films In: 10th International Summer School on Vacuum, Electron and Ion Technologies (VEIT 97), 1997-09-22 - 1997-09-27, VARNA, BULGARIA.

Bibic, N, Milosavljevic, M, Perusko, D and Jeynes, C (1998) Investigation of ion beam mixing effects in Ta/Pd bilayers deposited on Si In: 5th European Vacuum Conference (EVC 5) / 10th International Conference on Thin Films (ICTF 10), 1996-09-23 - 1996-09-27, UNIV SALAMANCA, SALAMANCA, SPAIN.

Nejim, A, Barradas, NP, Jeynes, C, Cristiano, F, Wendler, E, Gartner, K and Sealy, BJ (1998) Residual post anneal damage of Ge and C co-implantation of Si determined by quantitative RBS-channelling In: 5th European Conference on Accelerators in Applied Research and Technology (ECAART5), 1997-08-26 - 1997-08-30, EINDHOVEN UNIV, EINDHOVEN, NETHERLANDS.

Jeynes, C, Barradas, NP, Blewett, MJ and Webb, RP (1998) Improved ion beam analysis facilities at the University of Surrey In: 13th International Conference on Ion Beam Analysis (IBA-13), 1997-07-27 - 1997-08-01, LISBON, PORTUGAL.

Kozanecki, A, Jeynes, C, Sealy, BJ and Nejim, A (1998) Ion beam analysis of 6H SiC implanted with erbium and ytterbium ions In: 13th International Conference on Ion Beam Analysis (IBA-13), 1997-07-27 - 1997-08-01, LISBON, PORTUGAL.

Barradas, NP, Marriott, PK, Jeynes, C and Webb, RP (1998) The RBS data furnace: Simulated annealing In: 13th International Conference on Ion Beam Analysis (IBA-13), 1997-07-27 - 1997-08-01, LISBON, PORTUGAL.

Stojanovic, M, Milosavljevic, M and Jeynes, C (1998) Characterization of as implanted silicides by frequency noise level measurements In: 2nd Yugoslav Conference on Advanced Materials (YUGOMAT II), 1997-09-15 - 1997-09-19, HERCEG-NOVI, YUGOSLAVIA.

Kozanecki, A, Jeynes, C, Sealy, BJ, Jantsch, W, Lanzerstorfer, S, Heiss, W and Prechtl, G (1998) Photoluminescence and backscattering characterization of 6H SiC implanted with erbium and oxygen ions In: 7th International Conference on Silicon Carbide, III-Nitrides and Related Materials (ICSCIII-N 97), 1997-08-31 - 1997-09-05, STOCKHOLM, SWEDEN.

Puttick, K, Jeynes, C and Gee, T (1998) Surface amorphization of machined silicon In: 1998 Spring Topical Meeting of the ASPE on Silicon Machining, 1998-04-13 - 1998-04-16, CARMEL BY THE SEA, CA.

Kozanecki, N, Jantsch, W, Heis, W, Prechtl, G, Sealy, BJ and Jeynes, C (1997) Infrared luminescence in Er and Er+O implanted 6H SiC In: XXVI International School on Physics of Semiconducting Compounds, 1997-06-06 - 1997-06-13, JASZOWIEC, POLAND.

Murtagh, M, Lynch, SM, Kelly, PV, Hildebrant, S, Herbert, PAF, Jeynes, C and Crean, GM (1997) Photoreflectance characterisation of Ar+ ion etched and SiCl4 reactive ion etched silicon (100) In: 1st International Conference on Materials for Microelectronics, 1994-10-17 - 1994-10-19, BARCELONA, SPAIN.

Mironov, OA, Phillips, PJ, Parker, EHC, Dowsett, MG, Barradas, NP, Jeynes, C, Mironov, M, Gnezdilov, VP, Ushakov, V and Eremenko, VV (1997) Structural and optical characterisation of undoped Si-Si0.78Ge0.22/Si(001) superlattices grown by MBE In: Workshop on Molecular Beam Expitaxy-Growth Physics and Technology (MBE-GPT 96), 1996-10-21 - 1996-10-25, WARSAW, POLAND.

DeSouza, RA, Kilner, JA and Jeynes, C (1997) The application of secondary ion mass spectrometry (SIMS) to the study of high temperature proton conductors (HTPC) In: VIII International Conference on Solid State Protonic Conductors, 1996-08-18 - 1996-08-23, GOL, NORWAY.

Nejim, A, Jeynes, C, Webb, RP, Cowern, NEB and Patel, CJ (1997) Influence of dynamic annealing on the depth distribution of germanium implanted in (100) silicon at elevated temperatures In: Symposium on Defects and Diffusion in Silicon Processing, 1997-04-01 - 1997-04-04, SAN FRANCISCO, CA.

Wilson, IH, Chen, YJ, Xu, JB, Devine, RAB and Jeynes, C (1996) Ion impacts and nanostructures on Ge(111), In0.22Ga0.78As/GaAs(100) and alpha quartz surfaces observed by atomic force microscopy In: QSA-9 Conference, 1996-07-15 - 1996-07-19, GUILDFORD, ENGLAND.

Li, YP, Kilner, JA, Tate, TJ, Chater, RJ, Jeynes, C and Jafri, ZH (1996) SIMS, RBS, and ion channelling studies of H-2(+) or O-18(+) irradiated LaAlO3, (100) single crystal In: 12th International Conference on Ion Beam Analysis (IBA-12), 1995-05-22 - 1995-05-26, ARIZONA STATE UNIV CAMPUS, TEMPE, AZ.

Stojanovic, M, Jeynes, C, Bibic, N, Milosavljevic, M, Vasic, A and Milosevic, Z (1996) Frequency noise level of as ion implanted TiN-Ti-Si structures In: 16th International Conference on Atomic Collisions in Solids (ICACS-16), 1995-07-17 - 1995-07-21, LINZ, AUSTRIA.

Stojanovic, M, Vasic, A and Jeynes, C (1996) Ion implanted silicides studies by frequency noise level measurements In: Symposium J on Correlated Effects in Atomic and Cluster Ion Bombardment and Implantation/Symposium C on Pushing the Limits of Ion Beam Processing - From Engineering to Atomic Scale Issues, at the E-MRS 95 Spring Meeting, 1995-05-22 - 1995-05-26, STRASBOURG, FRANCE.

Book

Jeynes, Christopher (2013) Psalms: the Prayerbook of the Church UNSPECIFIED.

Jeynes, Christopher (2002) Science and Creation UNSPECIFIED.

Dataset

Jeynes, C, Florescu, M, Fortini, A, Sear, RP and Keddie, JL (2016) Data for Utgenannt et al - ACS Nano [Dataset]

Other

Jeynes, C, Barradas, NP and Webb, RP (1997) DataFurnace for Ion Beam Analysis University of Surrey Ion Beam Centre.

This list was generated on Sat Nov 25 03:22:12 2017 UTC.

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