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MUTTI, P, SKLAR, Z, BRIGGS, GAD and JEYNES, C (1995) ELASTIC PROPERTIES OF GAAS DURING AMORPHIZATION BY ION-IMPLANTATION JOURNAL OF APPLIED PHYSICS, 77 (6). pp. 2388-2392.

KAZOR, A, JEYNES, C and BOYD, IW (1994) FLUORINE ENHANCED OXIDATION OF SILICON AT LOW-TEMPERATURES APPLIED PHYSICS LETTERS, 65 (12). pp. 1572-1574.

CURRENT, MI, OHNO, N, HURLEY, K, KEENAN, WA, GUITNER, TL and JEYNES, C (1993) MICROUNIFORMITY MEASUREMENTS OF ION-IMPLANTED SILICON SOLID STATE TECHNOLOGY, 36 (7). 111-&.

DUNSTAN, DJ, DIXON, RH, KIDD, P, HOWARD, LK, WILKINSON, VA, LAMBKIN, JD, JEYNES, C, HALSALL, MP, LANCEFIELD, D, EMENY, MT, GOODHEW, PJ, HOMEWOOD, KP, SEALY, BJ and ADAMS, AR (1993) GROWTH AND CHARACTERIZATION OF RELAXED EPILAYERS OF INGAAS ON GAAS JOURNAL OF CRYSTAL GROWTH, 126 (4). pp. 589-600.

SHOJAI, A, REED, GT and JEYNES, C (1992) DIFFUSION OF ION-IMPLANTED NEODYMIUM IN SILICA JOURNAL OF PHYSICS D-APPLIED PHYSICS, 25 (8). pp. 1280-1283.

FAROOQI, AS, ARSHED, W, AKANLE, OA, JEYNES, C and SPYROU, NM (1992) FLUORINE DETERMINATION IN DIET SAMPLES USING CYCLIC INAA AND PIGE ANALYSIS JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY-ARTICLES, 161 (1). pp. 71-78.

STRICKLAND, KR, EDWARDS, SC, WIGMORE, JK, COLLINS, RA and JEYNES, C (1992) STUDY OF ION-IMPLANTATION AND ANNEALING EFFECTS IN SILICON-WAFERS USING HIGH-FREQUENCY PHONON-SCATTERING SURFACE AND INTERFACE ANALYSIS, 18 (8). pp. 631-636.

SPYROU, NM, ARSHED, W, FAROOQI, AS, IBEANU, GI, AKANLE, OA, JEYNES, C, ASUBIOJO, OI, OBIOH, IB, OLUYEMI, EA and OLUWOLE, AF (1992) USEFULNESS OF NUCLEAR AND ATOMIC-BASED ANALYSIS TECHNIQUES IN AIR-POLLUTION STUDIES IN NIGERIA JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY-ARTICLES, 161 (1). pp. 189-199.

TANG, YS, WILKINSON, CDW and JEYNES, C (1992) PD/TI BILAYER CONTACTS TO HEAVILY DOPED POLYCRYSTALLINE SILICON JOURNAL OF APPLIED PHYSICS, 72 (1). pp. 311-312.

MAHMOOD, F, AHMED, H, JEYNES, C and GILLIN, WP (1992) REACTIVE FORMATION OF COBALT SILICIDE ON SINGLE-CRYSTAL SILICON UNDER RAPID ELECTRON-BEAM HEATING APPLIED SURFACE SCIENCE, 59 (1). pp. 55-62.

MATTHEWS, AP, JEYNES, C, REESON, KJ, THORNTON, J and SPYROU, NM (1992) QUANTIFICATION OF THE SEPARATE MATRIX CONSTITUENTS OF SPHEROIDAL GRAPHITE CAST-IRON IMPLANTED WITH N-15 BY NUCLEAR-REACTION ANALYSIS USING AN ION MICROPROBE NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 64 (1-4). pp. 452-456.

PUTTICK, KE, JEYNES, C, RUDMAN, M, GEE, AE and CHAO, CL (1992) SURFACE DAMAGE IN NANOMACHINED SILICON SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 7 (2). pp. 255-259.

KOZANECKI, A, CHAN, M, JEYNES, C, SEALY, B and HOMEWOOD, K (1991) LATTICE LOCATION OF ERBIUM IMPLANTED INTO GAAS SOLID STATE COMMUNICATIONS, 78 (8). pp. 763-766.

BALIGA, CB, TSAKIROPOULOS, P and JEYNES, C (1991) SURFACE CONTAMINATION AND ITS EFFECT ON THE CORROSION OF RAPIDLY SOLIDIFIED MG-AL ALLOY SPLATS JOURNAL OF MATERIALS SCIENCE, 26 (6). pp. 1497-1504.

DEVEIRMAN, A, VANLANDUYT, J, REESON, KJ, GWILLIAM, R, JEYNES, C and SEALY, BJ (1990) IDENTIFICATION OF COSI INCLUSIONS WITHIN BURIED COSI2 LAYERS FORMED BY ION-IMPLANTATION JOURNAL OF APPLIED PHYSICS, 68 (7). pp. 3792-3794.

SPYROU, NM, ALTAF, WJ, GILL, BS, JEYNES, C, NICOLAOU, G, PIETRA, R, SABBIONI, E and SURIAN, M (1990) FLUORINE CONCENTRATIONS IN BONE-BIOPSY SAMPLES DETERMINED BY PROTON-INDUCED GAMMA-RAY EMISSION AND CYCLIC NEUTRON-ACTIVATION BIOLOGICAL TRACE ELEMENT RESEARCH, 26-7. pp. 161-168.

ALTRIP, JL, EVANS, AGR, LOGAN, J and JEYNES, C (1990) HIGH-TEMPERATURE MILLISECOND ANNEALING OF ARSENIC IMPLANTED SILICON SOLID-STATE ELECTRONICS, 33 (6). pp. 659-664.

CREAN, GM, COLE, PD and JEYNES, C (1990) RANGE DISTRIBUTIONS OF ION-IMPLANTED BORON, PHOSPHORUS AND ARSENIC DOPANTS IN THERMALLY REACTED TITANIUM SILICIDE THIN-FILMS SOLID-STATE ELECTRONICS, 33 (6). pp. 655-658.

BRUNSON, KM, SANDS, D, THOMAS, CB, JEYNES, C and WATTS, JF (1990) COMPOSITION AND STRUCTURE OF SEMI-INSULATING POLYCRYSTALLINE SILICON THIN-FILMS PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 61 (3). pp. 361-376.

JAFRI, ZH, JEYNES, C, WEBB, RP and WILSON, IH (1990) MASS-TRANSPORT OF SILICON DURING ARGON IRRADIATION EMPLOYING A DOUBLE-MARKER SYSTEM NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 48 (1-4). pp. 457-460.

AJAYI, OB, AKANNI, MS, LAMBI, JN, JEYNES, C and WATTS, JF (1990) COMPOSITIONAL STUDIES OF VARIOUS METAL-OXIDE COATINGS ON GLASS THIN SOLID FILMS, 185 (1). pp. 123-136.

SEALY, BJ, TAN, BL, GWILLIAM, RM, REESON, KJ and JEYNES, C (1989) RESISTIVITY OF ION-BEAM SYNTHESIZED COSI2 ELECTRONICS LETTERS, 25 (22). pp. 1532-1533.

ONEILL, M, BRYCE, AC, MARSH, JH, DELARUE, RM, ROBERTS, JS and JEYNES, C (1989) MULTIPLE QUANTUM WELL OPTICAL WAVE-GUIDES WITH LARGE ABSORPTION-EDGE BLUE SHIFT PRODUCED BY BORON AND FLUORINE IMPURITY-INDUCED DISORDERING APPLIED PHYSICS LETTERS, 55 (14). pp. 1373-1375.

STOEV, IG, YANKOV, RA and JEYNES, C (1989) FORMATION OF ETCH-STOP STRUCTURES UTILIZING ION-BEAM SYNTHESIZED BURIED OXIDE AND NITRIDE LAYERS IN SILICON SENSORS AND ACTUATORS, 19 (2). pp. 183-197.

JAFRI, ZH, JEYNES, C, WEBB, RP and WILSON, IH (1989) OBSERVATION OF SWELLING AND SPUTTERING OF A SILICON TARGET UNDER ARGON ION IRRADIATION USING A DOUBLE MARKER TECHNIQUE VACUUM, 39 (11-12). pp. 1119-1121.

RAMAN, VK, MAHMOOD, F, MCMAHON, RA, AHMED, H, JEYNES, C and SARKAR, D (1989) RAPID ELECTRON-BEAM INDUCED TANTALUM SILICON REACTIONS APPLIED SURFACE SCIENCE, 36 (1-4). pp. 654-663.

REESON, K, DEVEIRMAN, A, GWILLIAM, R, JEYNES, C, SEALY, B and VANLANDUYT, J (1989) TEM AND RBS STUDIES OF EPITAXIAL COSI2 LAYERS FORMED BY HIGH-DOSE COBALT IMPLANTATION INTO SILICON INST PHYS CONF SER (100). pp. 627-634.

RAMAN, VK, MAHMOOD, F, MCMAHON, RA, AHMED, H and JEYNES, C (1988) RAPID ELECTRON-BEAM REACTED TANTALUM TITANIUM BILAYERS ON SILICON JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 27 (12). pp. 2333-2339.

RAMAN, VK, MAHMOOD, F, MCMAHON, RA, AHMED, H, JEYNES, C, HUTT, KW, COOPER, N and GODFREY, DJ (1988) CHARACTERIZATION OF RAPID ELECTRON-BEAM ANNEALED THIN TITANIUM SILICIDE FILMS JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 135 (3). C125-C125.

SEAH, MP, DAVID, D, DAVIES, JA, JACKMAN, TE, JEYNES, C, ORTEGA, C, READ, PM, SOFIELD, CJ and WEBER, G (1988) AN INTERCOMPARISON OF ABSOLUTE MEASUREMENTS OF THE OXYGEN AND TANTALUM THICKNESS OF TANTALUM PENTOXIDE REFERENCE MATERIALS, BCR 261, BY 6 LABORATORIES NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 30 (2). pp. 140-151.

MATTHEWS, AP, JEYNES, C, REESON, KJ, THORNTON, J and SPYROU, NM (1988) NUCLEAR-REACTION STUDIES OF N-15 IMPLANTED SPHEROIDAL GRAPHITE CAST-IRON USING AN ION MICROPROBE NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 30 (3). pp. 497-502.

DANN, AJ, FAHY, MR, JEYNES, C and WILLIS, MR (1987) ELECTRICAL-PROPERTIES OF ION-IMPLANTED PCALF FILMS PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 101 (1). K45-K48.

DANN, AJ, FAHY, MR, WILLIS, MR and JEYNES, C (1987) ION-IMPLANTATION OF POLYMERIC PHTHALOCYANINES SYNTHETIC METALS, 18 (1-3). pp. 581-584.

KIMBER, AC and JEYNES, C (1987) AN APPLICATION OF THE TRUNCATED 2-PIECE NORMAL-DISTRIBUTION TO THE MEASUREMENT OF DEPTHS OF ARSENIC IMPLANTS IN SILICON JOURNAL OF THE ROYAL STATISTICAL SOCIETY SERIES C-APPLIED STATISTICS, 36 (3). pp. 352-357.

DANN, AJ, FAHY, MR, JEYNES, C and WILLIS, MR (1986) IODINE IMPLANTATION OF POLYMERIC PHTHALOCYANINES JOURNAL OF PHYSICS D-APPLIED PHYSICS, 19 (11). L217-L224.

RENNIE, J, ELLIOTT, S and JEYNES, C (1986) RUTHERFORD BACKSCATTERING STUDY OF THE PHOTODISSOLUTION OF AG IN AMORPHOUS GESE2 APPLIED PHYSICS LETTERS, 48 (21). pp. 1430-1432.

DUCKWORTH, RG, HARPER, RE and JEYNES, C (1986) BACKSCATTERING ANALYSIS OF ZRN ALLOYS NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 15 (1-6). pp. 272-274.

BANGERT, U, GOODHEW, PJ, JEYNES, C and WILSON, IH (1986) LOW-ENERGY (2-5 KEV) ARGON DAMAGE IN SILICON JOURNAL OF PHYSICS D-APPLIED PHYSICS, 19 (4). pp. 589-603.

JEYNES, C, MILES, RE, BOLT, M and SIMMONS, JG (1986) RAPID ANALYSIS OF SIPOS FILMS BY ELASTIC BACKSCATTERING AND RBS NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 15 (1-6). pp. 275-279.

WEBB, RP, JEYNES, C and WILSON, IH (1986) THE EFFECT OF ANGLE OF INCIDENCE ON INTERFACE BROADENING NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 13 (1-3). pp. 449-452.

MILOSAVLJEVIC, M, JEYNES, C and WILSON, IH (1985) EPITAXIAL (100) SILICON FILMS GROWN AT LOW-TEMPERATURES IN AN ELECTRON-BEAM EVAPORATOR JOURNAL OF APPLIED PHYSICS, 57 (4). pp. 1252-1255.

JEYNES, C and KIMBER, AC (1985) HIGH-ACCURACY DATA FROM RUTHERFORD BACKSCATTERING SPECTRA - MEASUREMENTS OF THE RANGE AND STRAGGLING OF 60-400 KEV AS IMPLANTS INTO SI JOURNAL OF PHYSICS D-APPLIED PHYSICS, 18 (8). L93-L97.

MYNARD, JE, JEYNES, C, THORNTON, J, WAY, A, WEBB, R, ALBURY, D, HEMMENT, PLF and STEPHENS, KG (1985) IMPROVED FACILITIES FOR ION-BEAM SURFACE-ANALYSIS AT THE UNIVERSITY-OF-SURREY NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 6 (1-2). pp. 264-269.

BANGERT, U, JEYNES, C, GOODHEW, P and WILSON, IH (1984) DAMAGE EFFECTS IN SILICON AND MNOS STRUCTURES CAUSED BY BEAMS OF IONIZED AND NEUTRAL ARGON ATOMS WITH ENERGIES BELOW 5 KEV VACUUM, 34 (1-2). pp. 163-166.

MILOSAVLJEVIC, M, JEYNES, C and WILSON, IH (1984) SOLID-PHASE EPITAXY OF EVAPORATED AMORPHOUS-SILICON FILMS APPLIED PHYSICS LETTERS, 45 (8). pp. 874-876.

JEYNES, C (1983) A PROPOSED DIAMOND POLISHING PROCESS PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 48 (2). pp. 169-197.

JEYNES, C (1978) NATURAL POLYCRYSTALLINE DIAMOND INDUSTRIAL DIAMOND REVIEW (JAN). pp. 14-23.

Conference or Workshop Item

MILOSAVLJEVIC, M, BIBIC, N, PERUSKO, D and JEYNES, C (1995) INFLUENCE OF ARSENIC ION-IMPLANTATION ON THE FORMATION OF TI-SILICIDES In: 4th European Vacuum Conference (EVC-4)1st Swedish Vacuum Meeting (SVM-1), 1994-06-13 - 1994-06-17, UPPSALA, SWEDEN.

BACHMANN, T, WENDLER, E, WESCH, W, HERRE, O, WILSON, RJ, JEYNES, C, GWILLIAM, RM and SEALY, BJ (1995) DAMAGE PRODUCTION DURING MEV ION-IMPLANTATION IN GAAS AND INAS In: 13th International Conference on the Application of Accelerators in Research and Industry, 1994-11-07 - 1994-11-10, DENTON, TX.

WENDLER, E, WILSON, RJ, JEYNES, C, WESCH, W, GARTNER, K, GWILLIAM, RM and SEALY, BJ (1995) 2 MEV AS+ IMPLANTATION IN INAS In: 10th International Conference on Ion Implantation Technology, 1994-06-13 - 1994-06-17, CATANIA, ITALY.

YOUSIF, KM, SMITH, BE and JEYNES, C (1994) STUDY OF DURABILITY OF (MOLYBDENUM-COPPER)-BLACK COATINGS IN RELATION TO THEIR USE AS SOLAR SELECTIVE ABSORBERS In: World Renewable Energy Congress - Climate Change, Energy and the Environment, 1994-09-11 - 1994-09-16, READING, ENGLAND.

KOZANECKI, A, SEALY, BJ, JEYNES, C, GILLIN, WP and GREY, R (1994) INTERDIFFUSION AND THERMALLY-INDUCED STRAIN RELAXATION IN GAAS/IN0.2GA0.8AS/GAAS SINGLE-QUANTUM-WELL STRUCTURES In: 11th International Conference on Ion Beam Analysis (IBA-11), 1993-07-05 - 1993-07-09, BALATONFURED, HUNGARY.

PEEL, RMA, MILLEN, D, JEYNES, C and WEBB, RP (1994) TRANSPUTERS IN A DISTRIBUTED DATA-COLLECTION SYSTEM FOR MEV ION MICROBEAM ANALYSIS In: 17th World-Occam-and-Transputer-User-Group Technical Meeting, 1994-04-10 - 1994-04-13, BRISTOL, ENGLAND.

LYNCH, S, MURTAGH, M, CREAN, GM, KELLY, PV, OCONNOR, M and JEYNES, C (1993) NONDESTRUCTIVE DEPTH PROFILING OF SILICON ION-IMPLANTATION INDUCED DAMAGE IN SILICON (100) SUBSTRATES In: 1ST INTERNATIONAL CONF ON SPECTROSCOPIC ELLIPSOMETRY, 1993-01-11 - 1993-01-14, MINIST RECH & ESPACE, PARIS, FRANCE.

KING, BV, JEYNES, C, WEBB, RP and KILNER, JA (1993) ION-BEAM MIXING OF ISOTOPIC SILVER BILAYERS BY 200 KEV GERMANIUM In: 8TH INTERNATIONAL CONF ON ION BEAM MODIFICATION OF MATERIALS, 1992-09-07 - 1992-09-11, HEIDELBERG, GERMANY.

HEMMENT, PLF, SEALY, BJ, STEPHENS, KG, MYNARD, JE, JEYNES, C, BROWTON, MD, WILSON, RJ, MA, MX, CANSELL, A, MOUS, DJW and KOUDIJS, R (1993) A 2-MV HEAVY-ION VANDEGRAAFF IMPLANTER FOR RESEARCH-AND-DEVELOPMENT In: 9TH INTERNATIONAL CONF ON ION IMPLANTATION TECHNOLOGY, 1992-09-20 - 1992-09-24, UNIV FLORIDA, GAINESVILLE, FL.

BIBIC, N, MILOSAVLJEVIC, M, PERUSKO, D, SERRUYS, Y and JEYNES, C (1992) ION-BEAM INDUCED MIXING IN PD THIN-FILMS ON SILICON In: 14TH INTERNATIONAL CONF ON ATOMIC COLLISIONS IN SOLIDS ( ICACIS-14 ), 1991-07-28 - 1991-08-02, UNIV SALFORD, SALFORD, ENGLAND.

MURTAGH, M, CREAN, GM, FLAHERTY, T and JEYNES, C (1992) SENSITIVITY OF A MODULATED OPTICAL REFLECTANCE PROBE TO PROCESS-INDUCED LATTICE DISORDER In: SYMP OF THE 1991 SPRING CONF OF THE EUROPEAN MATERIALS RESEARCH SOC : LASER SURFACE PROCESSING AND CHARACTERIZATION, 1991-05-28 - 1991-05-31, STRASBOURG, FRANCE.

CURRENT, MI, GUITNER, T, OHNO, N, HURLEY, K, KEENAN, WA, JOHNSON, W, HILLARD, RJ and JEYNES, C (1991) MONITORING THE MICRO-UNIFORMITY PERFORMANCE OF A SPINNING DISK IMPLANTER In: 8TH INTERNATIONAL CONF ON ION IMPLANTATION TECHNOLOGY, 1990-07-30 - 1990-08-03, UNIV SURREY, GUILDFORD, ENGLAND.

MILOSAVLJEVIC, M, BIBIC, N, PERUSKO, D, WILSON, IH and JEYNES, C (1990) PROCESSING OF TIN/TI METALLIZATION ON SILICON BY ARSENIC ION-IMPLANTATION In: 17TH INTERNATIONAL CONF ON METALLURGICAL COATINGS / 8TH INTERNATIONAL CONF ON THIN FILMS, 1990-04-02 - 1990-04-06, SAN DIEGO, CA.

REESON, KJ, STANLEY, CJ, JEYNES, C, GRIME, G and WATT, F (1990) PIXE ANALYSIS TO DETERMINE THE TRACE-ELEMENT CONCENTRATIONS IN A SERIES OF GALENA (PBS) SPECIMENS FROM DIFFERENT LOCALITIES In: 9TH INTERNATIONAL CONF ON ION BEAM ANALYSIS, 1989-06-26 - 1989-06-30, QUEENS UNIV, KINGSTON, CANADA.

SINGH, M, LIGHTOWLERS, EC, DAVIES, G, JEYNES, C and REESON, KJ (1989) ISOELECTRONIC BOUND EXCITON PHOTOLUMINESCENCE FROM A METASTABLE DEFECT IN SULFUR-DOPED SILICON In: SYMP AT THE 1989 SPRING MEETING OF THE EUROPEAN MATERIALS SOC : SCIENCE AND TECHNOLOGY OF DEFECTS IN SILICON, 1989-05-30 - 1989-06-02, COUNCIL EUROPE & EUROPEAN PARLIAMENT, STRASBOURG, FRANCE.

JEYNES, C (1989) NOVEL APPLICATIONS OF ION-IMPLANTATION In: 5TH INTERNATIONAL CONF ON LOW ENERGY ION BEAMS, 1989-04-03 - 1989-04-06, UNIV SURREY, GUILDFORD, ENGLAND.

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