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Items where Author is "Evans-Freeman, J"

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Article

Jianqing, Wen, Evans-Freeman, J., Peaker, A. R., Zhang, J. P., Hemment, Peter L. F., Marsh, C. D. and Booker, G. R. (2000) Role of oxygen on the implantation related residual defects in silicon IEEE Proceedings of Electron Devices Meeting, Hong Kong, 2000.. pp. 112-115.

Conference or Workshop Item

Peaker, AR, Evans-Freeman, JH, Kan, PYY, Hawkins, ID, Terry, J, Jeynes, C and Rubaldo, L (2000) Vacancy-related defects in ion implanted and electron irradiated silicon In: Symposium F: Process Induced Defects in Semiconductors at the 1999 Spring Meeting of the European-Materials-Research-Society, 1999-06-01 - 1999-06-04, STRASBOURG, FRANCE.

Naveed, AT, Huda, MQ, Abd El-Rahman, KF, Hartung, J, Evans-Freeman, JH, Peaker, AR, Houghton, DC, Jeynes, C and Gillin, WP (1998) Erbium in silicon-germanium quantum wells In: Symposium on Light Emission from Silicon - Procress Towards Si-based Optoelectronics at the Spring Meeting of the European-Materials-Research-Society, 1998-06-16 - 1998-06-19, STRASBOURG, FRANCE.

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