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Items where Author is "Diplas, S"

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Diplas, S, Avice, M, Thogersen, A, Christensen, JS, Grossner, U, Svensson, BG, Nilsen, O, Fjelivag, H, Hinderc, S and Watts, JF (2008) Interfacial studies of Al2O3 deposited on 4H-SiC(0001) SURFACE AND INTERFACE ANALYSIS, 40 (3-4). pp. 822-825.

Thogersen, A, Diplas, S, Mayandi, J, Finstad, T, Olsen, A, Watts, JF, Mitome, M and Bando, Y (2008) An experimental study of charge distribution in crystalline and amorphous Si nanoclusters in thin silica films JOURNAL OF APPLIED PHYSICS, 103 (2), ARTN 0.

Moslemzadeh, N, Beamson, G, Diplas, S, Tsakiropoulos, P and Watts, JF (2008) Monitoring atomic level electronic changes in the alloying of stainless steels with Auger and photoelectron spectroscopy SURFACE SCIENCE, 602 (1). pp. 216-225.

Avice, M, Diplas, S, Thogersen, A, Christensen, JS, Grossner, U, Svensson, BG, Nilsen, O, Fjellvag, H and Watts, JF (2007) Rearrangement of the oxide-semiconductor interface in annealed Al2O3/4H-SiC structures APPLIED PHYSICS LETTERS, 91 (5), ARTN 0.

Diplas, S, Prytz, O, Karlsen, OB, Watts, JF and Tafto, J (2007) A quantitative study of valence electron transfer in the skutterudite compound CoP3 by combining x-ray induced Auger and photoelectron spectroscopy JOURNAL OF PHYSICS-CONDENSED MATTER, 19 (24), ARTN 24621.

Diplas, S, Lehrmann, J, Jorgensen, S, Valand, T, Watts, JF and Tafto, J (2005) Characterization of Ni-B amorphous alloys with x-ray photoelectron and secondary ion mass spectroscopy SURFACE AND INTERFACE ANALYSIS, 37 (5). pp. 459-465.

Diplas, S, Tsakiropoulos, P, Shao, G, Watts, JF and Matthew, JAD (2002) A study of alloying behaviour in the Ti-Al-V system ACTA MATERIALIA, 50 (8), PII S1359-. pp. 1951-1960.

Mitchell, T, Diplas, S, Tsakiropoulos, P, Watts, JF and Matthew, JAD (2002) Study of alloying behaviour in metastable Mg-Ti solid solutions using Auger parameter measurements and charge-transfer calculations PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 82 (4). pp. 841-855.

Diplas, S, Watts, JF, Tsakiropoulos, P, Shao, G, Beamson, G and Matthew, JAD (2001) X-ray photoelectron spectroscopy studies of Ti-Al and Ti-Al-V alloys using CrK beta radiation SURFACE AND INTERFACE ANALYSIS, 31 (8). pp. 734-744.

Arvanitis, A, Diplas, S, Tsakiropoulos, P, Watts, JF, Whiting, MJ, Morton, SA and Matthew, JAD (2001) An experimental study of bonding and crystal structure modifications in MoSi2 and MoSi2+xAl (x=10 to 40 at% Al) via Auger parameter shifts and charge transfer calculations ACTA MATERIALIA, 49 (6). pp. 1063-1078.

Diplas, S, Watts, JF, Morton, SA, Beamson, G, Tsakiropoulos, P, Clark, DT and Castle, JE (2001) Electron spectroscopy with CrK beta photons: high energy XPS and X-AES JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 113 (2-3). pp. 153-166.

Diplas, S, Shao, G, Tsakiropoulos, P, Watts, JF and Matthew, JAD (2000) Calculations of charge transfer in Mg- and Al-transition metal alloys using the Auger parameter SURFACE AND INTERFACE ANALYSIS, 29 (1). pp. 65-72.

Diplas, S, Tsakiropoulos, P, Brydson, RMD and Watts, JF (1999) Development of physical vapour deposited Mg-Zr alloys - Part 2 - Characterisation of corrosion products MATERIALS SCIENCE AND TECHNOLOGY, 15 (12). pp. 1359-1372.

Conference or Workshop Item

Diplas, S, Moslemzadeh, N, Watts, JF, Beamson, G and Tsakiropoulos, P (2010) An XPS study of the interatomic charge distribution in stainless steels In: 13th European Conference on Applications of Surface and Interface Analysis, 2009-10-18 - 2009-10-23, Antalya, TURKEY.

Diplas, S, Ulyashin, A, Maknys, K, Gunnaes, AE, Jorgensen, S, Wright, D, Watts, JF, Olsen, A and Finstad, TG (2007) On the processing-structure-property relationship of ITO layers deposited on crystalline and amorphous Si In: 1st International Symposium on Transparent Conducting Oxides, 2006-10-23 - 2006-10-25, Crete, GREECE.

Diplas, S, Jorgensen, S, Tafto, J, Tonnessen, T, Knutsen, T, Lehrmann, J, Valand, T, Abel, ML and Watts, JF (2006) Probing the electronic structure of Ni-X, (X = B, S, P) catalysts with XPS In: 11th European Conference on Applications of Surface and Interface Anlaysis, 2005-09-25 - 2005-09-30, Vienna, AUSTRIA.

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