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Items where Author is "Burdess, J"

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Bowden, M, Gardiner, DJ, Lourenco, MA, Hedley, J, Wood, D, Burdess, JS and Harris, AJ (1998) Dopant mapping and strain analysis in B doped silicon structures using micro-Raman spectroscopy In: Symposium on Microelectromechanical Structures for Materials Research, 1998-04-15 - 1998-04-16, SAN FRANCISCO, CA.

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