Items where Author is "Bemporad, E"
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Korsunsky, A.M., Salvati, E., Lunt, A.G.J., Sui, Tan, Mughal, M.Z., Daniel, R., Keckes, J., Bemporad, E. and Sebastiani, M. (2018) Nanoscale residual stress depth profiling by Focused Ion Beam milling and eigenstrain analysis Materials & Design, 145. pp. 55-64.