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Items where Author is "Barradas, N"

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Article

James, CD, Jeynes, C, Barradas, NP, Clifton, L, Dalgliesh, RM, Smith, RF, Sankey, SW, Hutchings, LR and Thompson, RL (2015) Modifying polyester surfaces with incompatible polymer additives REACTIVE & FUNCTIONAL POLYMERS, 89. pp. 40-48.

Jeynes, C, Barradas, NP and Szilágyi, E (2012) Accurate Determination of Quantity of Material in Thin Films by Rutherford Backscattering Spectrometry Analytical Chemistry, 84. pp. 6061-6069.

Abriola, D, Barradas, NP, Bogdanović-Radović, I, Chiari, M, Gurbich, AF, Jeynes, C, Kokkoris, M, Mayer, M, Ramos, AR, Shi, L and Vickridge, I (2011) Development of a reference database for Ion Beam Analysis and future perspectives Nuclear Instruments and Methods in Physics Research B, 269 (24). pp. 2972-2978.

Gurbich, AF, Abriola, D, Barradas, NP, Ramos, AR, Bogdanovic-Radovic, I, Chiari, M, Jeynes, C, Kokkoris, M, Mayer, M, Shi, L and Vickridge, I (2011) Measurements and Evaluation of Differential Cross-sections for Ion Beam Analysis JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 59 (2). pp. 2010-2013.

Barradas, NP and Jeynes, C (2008) Advanced physics and algorithms in the IBA DataFurnace NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 266 (8). pp. 1875-1879.

Beck, L, Jeynes, C and Barradas, NP (2008) Characterization of paint layers by simultaneous self-consistent fitting of RBS/PIXE spectra using simulated annealing NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 266 (8). pp. 1871-1874.

Barradas, NP, Arstila, K, Battistig, G, Bianconi, M, Dytlewski, N, Jeynes, C, Kotai, E, Lulli, G, Mayer, M, Rauhala, E, Szilagyi, E and Thompson, M (2007) International Atomic Energy Agency intercomparison of ion beam analysis software NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 262 (2). pp. 281-303.

Pascual-Izarra, C, Barradas, NP, Reis, MA, Jeynes, C, Menu, M, Lavedrine, B, Jacques Ezrati, J and Roehrs, S (2007) Towards truly simultaneous PIXE and RBS analysis of layered objects in cultural heritage NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 261 (1-2). pp. 426-429.

Jeynes, C, Peng, N, Barradas, NP and Gwilliam, RM (2006) Quality assurance in an implantation laboratory by high accuracy RBS NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 249. pp. 482-485.

Barradas, NP, Alves, E, Jeynes, C and Tosaki, M (2006) Accurate simulation of backscattering spectra in the presence of sharp resonances NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 247 (2). pp. 381-389.

Barradas, NP, Added, N, Arnoldbik, WM, Bogdanovic-Radovic, I, Bohne, W, Cardoso, S, Danner, C, Dytlewski, N, Freitas, PP, Jaksic, M, Jeynes, C, Krug, C, Lennard, WN, Lindner, S, Linsmeier, C, Medunic, Z, Pelicon, P, Pezzi, RP, Radtke, C, Rohrich, J, Sajavaara, T, Salgado, TDM, Stedile, FC, Tabacniks, MH and Vickridge, I (2005) A round robin characterisation of the thickness and composition of thin to ultra-thin AlNO films NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 227 (3). pp. 397-419.

Jeynes, C, Barradas, NP, Marriott, PK, Boudreault, G, Jenkin, M, Wendler, E and Webb, RP (2003) Elemental thin film depth profiles by ion beam analysis using simulated annealing - a new tool JOURNAL OF PHYSICS D-APPLIED PHYSICS, 36 (7), PII S0. R97-R126.

Barradas, NP, Jeynes, C, Webb, RP and Wendler, E (2002) Accurate determination of the stopping power of He-4 in Si using Bayesian inference NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 194 (1), PII S0168-. pp. 15-25.

Gurbich, AF, Barradas, NP, Jeynes, C and Wendler, E (2002) Applying elastic backscattering spectrometry when the nuclear excitation function has a fine structure NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 190, PII S0168-. pp. 237-240.

Vieira, A, Barradas, NP and Jeynes, C (2001) Error performance analysis of artificial neural networks applied to Rutherford backscattering SURFACE AND INTERFACE ANALYSIS, 31 (1). pp. 35-38.

Ross, GJ, Barradas, NP, Hill, MP, Jeynes, C, Morrissey, P and Watts, JF (2001) Rutherford backscattering spectrometry and computer simulation for the in-depth analysis of chemically modified poly(vinylidene fluoride) JOURNAL OF MATERIALS SCIENCE, 36 (19). pp. 4731-4738.

Jeynes, C, Barradas, NP, Rafla-Yuan, H, Hichwa, BP and Close, R (2000) Accurate depth profiling of complex optical coatings SURFACE AND INTERFACE ANALYSIS, 30 (1). pp. 237-242.

Jeynes, C, Barradas, NP, Wilde, JR and Greer, AL (2000) Composition of Ni-Ta-C thick films using simulated annealing analysis of elastic backscattering spectrometry data NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 161. pp. 287-292.

Nejim, A, Gwilliam, RM, Emerson, NG, Knights, AP, Cristiano, F, Barradas, NP and Jeynes, C (1999) Electrical behaviour associated with defect tails in germanium implanted silicon Proceedings of the International Conference on Ion Implantation Technology, 1. pp. 506-509.

Cappellani, A, Keddie, JL, Barradas, NP and Jackson, SM (1999) Processing and characterisation of sol-gel deposited Ta2O5 and TiO2-Ta2O5 dielectric thin films SOLID-STATE ELECTRONICS, 43 (6). pp. 1095-1099.

Barradas, NP, Jeynes, C, Jenkin, M and Marriott, PK (1999) Bayesian error analysis of Rutherford backscattering spectra THIN SOLID FILMS, 343. pp. 31-34.

Toal, SJ, Reehal, HS, Webb, SJ, Barradas, NP and Jeynes, C (1999) Structural analysis of nanocrystalline SiC thin films grown on silicon by ECR plasma CVD THIN SOLID FILMS, 343. pp. 292-294.

Barradas, NP, Knights, AP, Jeynes, C, Mironov, OA, Grasby, TJ and Parker, EHC (1999) High-depth-resolution Rutherford backscattering data and error analysis of SiGe systems using the simulated annealing and Markov chain Monte Carlo algorithms PHYSICAL REVIEW B, 59 (7). pp. 5097-5105.

Barradas, NP, Almeida, SA, Jeynes, C, Knights, AP, Silva, SRP and Sealy, BJ (1999) RBS and ERDA study of ion beam synthesised amorphous gallium nitride NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 148 (1-4). pp. 463-467.

Barradas, NP, Jeynes, C, Webb, RP, Kreissig, U and Grotzschel, R (1999) Unambiguous automatic evaluation of multiple Ion Beam Analysis data with Simulated Annealing NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 149 (1-2). pp. 233-237.

Barradas, NP, Keddie, JL and Sackin, R (1999) Bayesian inference analysis of ellipsometry data Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics, 59 (5). pp. 6138-6151.

Nejim, A., Cristiano, F., Knights, A. P., Barradas, N. P., Hemment, P. L. F. and Coleman, P. G. (1998) Dose rate dependence of residual defects in device grade Si/SiGe heterostructures formed by ion beam synthesis Proceedings of the 1998 International Conference on Ion Implantation Technology, 2. pp. 692-695.

Barradas, NP, Jeynes, C, Mironov, OA, Phillips, PJ and Parker, EHC (1998) High depth resolution Rutherford backscattering analysis of Si-Si0.78Ge0.22/(0 0 1)Si superlattices NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 139 (1-4). pp. 239-243.

Barradas, NP, Jeynes, C, Homewood, KP, Sealy, BJ and Milosavljevic, M (1998) RBS/simulated annealing analysis of silicide formation in Fe/Si systems NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 139 (1-4). pp. 235-238.

Barradas, NP, Jeynes, C and Jackson, SM (1998) RBS/simulated annealing analysis of buried SiCOx layers formed by implantation of O into cubic silicon carbide NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 136. pp. 1168-1171.

Barradas, NP, Jeynes, C and Harry, MA (1998) RBS/simulated annealing analysis of iron-cobalt silicides NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 136. pp. 1163-1167.

Barradas, NP, Jeynes, C and Webb, RP (1997) Simulated annealing analysis of Rutherford backscattering data APPLIED PHYSICS LETTERS, 71 (2). pp. 291-293.

Book Section

Jeynes, C and Barradas, NP (2009) Pitfalls in Ion Beam Analysis In: Handbook of Modern Ion Beam Materials Analysis. Materials Research Society, Warrendale Pennsylvania, pp. 347-383. ISBN 1605112151

Conference or Workshop Item

Barradas, NP, Arstila, K, Battistig, G, Bianconi, M, Dytlewski, N, Jeynes, C, Kotai, E, Lulli, G, Mayer, M, Rauhala, E, Szilagyi, E and Thompson, M (2008) Summary of "IAEA intercomparison of IBA software" In: 18th International Conference on Ion Beam Analysis, 2007-09-23 - 2007-09-28, Univ Hyderabad, Sch Phys, Hyderabad, INDIA.

Martinez, FL, Ruiz-Merino, R, del Prado, A, San Andres, E, Martil, I, Gonzalez-Diaz, G, Jeynes, C, Barradas, NP, Wang, L and Reehal, HS (2004) Bonding structure and hydrogen content in silicon nitride thin films deposited by the electron cyclotron resonance plasma method In: 8th European Vacuum Congress (EVC-8)/2nd Annual Conference of the German-Vacuum-Society (DVG), 2003-06-23 - 2003-06-26, Berlin, GERMANY.

Barradas, NP, Khan, RUA, Anguita, JV, Silva, SRP, Kreissig, U, Grotzschel, R and Moller, W (2000) Growth and characterisation of amorphous carbon films doped with nitrogen In: 14th International Conference on Ion Beam Analysis/6th European Conference on Accelerators in Applied Research and Technology, 1999-07-26 - 1999-07-30, DRESEDEN, GERMANY.

Toal, SJ, Reehal, HS, Barradas, NP and Jeynes, C (1999) Growth of microcrystalline beta-SiC films on silicon by ECR plasma CVD In: Symposium on Surface Processing - Laser, Lamp, Plasma, at the Annual Spring Meeting of the European-Materials-Society (E-MRS 96), 1996-06-16 - 1998-06-19, STRASBOURG, FRANCE.

Barradas, NP, Jeynes, C, Kusano, Y, Evetts, JE and Hutchings, IM (1999) RBS/simulated annealing and FTIR characterisation of BCN films deposited by dual cathode magnetron sputtering In: 15th International Conference on the Application of Accelerators in Research and Industry, 1998-11-04 - 1998-11-07, UNIV N TEXAS, DENTON, TX.

Marriott, PK, Jenkin, M, Jeynes, C, Barradas, NP, Webb, RP and Sealy, BJ (1999) Rapid accurate automated analysis of complex ion beam analysis data In: 15th International Conference on the Application of Accelerators in Research and Industry, 1998-11-04 - 1998-11-07, UNIV N TEXAS, DENTON, TX.

Kozanecki, A, Jeynes, C, Barradas, NP, Sealy, BJ and Jantsch, W (1999) The influence of implantation and annealing conditions on optical activity of Er3+ ions in 6H SiC In: 11th International Conference on Ion Beam Modification of Materials (IBMM98), 1998-08-31 - 1998-09-04, ROYAL TROP INST, AMSTERDAM, NETHERLANDS.

Nejim, A, Barradas, NP, Jeynes, C, Cristiano, F, Wendler, E, Gartner, K and Sealy, BJ (1998) Residual post anneal damage of Ge and C co-implantation of Si determined by quantitative RBS-channelling In: 5th European Conference on Accelerators in Applied Research and Technology (ECAART5), 1997-08-26 - 1997-08-30, EINDHOVEN UNIV, EINDHOVEN, NETHERLANDS.

Jeynes, C, Barradas, NP, Blewett, MJ and Webb, RP (1998) Improved ion beam analysis facilities at the University of Surrey In: 13th International Conference on Ion Beam Analysis (IBA-13), 1997-07-27 - 1997-08-01, LISBON, PORTUGAL.

Barradas, NP, Marriott, PK, Jeynes, C and Webb, RP (1998) The RBS data furnace: Simulated annealing In: 13th International Conference on Ion Beam Analysis (IBA-13), 1997-07-27 - 1997-08-01, LISBON, PORTUGAL.

Mironov, OA, Phillips, PJ, Parker, EHC, Dowsett, MG, Barradas, NP, Jeynes, C, Mironov, M, Gnezdilov, VP, Ushakov, V and Eremenko, VV (1997) Structural and optical characterisation of undoped Si-Si0.78Ge0.22/Si(001) superlattices grown by MBE In: Workshop on Molecular Beam Expitaxy-Growth Physics and Technology (MBE-GPT 96), 1996-10-21 - 1996-10-25, WARSAW, POLAND.

Other

Jeynes, C, Barradas, NP and Webb, RP (1997) DataFurnace for Ion Beam Analysis University of Surrey Ion Beam Centre.

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