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Items where Author is "Alzanki, T"

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Number of items: 10.

Article

Alenezi, MR, Alzanki, TH, Almeshal, AM, Alshammari, AS, Beliatis, MJ, Henley, SJ and Silva, SRP (2015) A model for the impact of the nanostructure size on its gas sensing properties RSC ADVANCES, 5 (125). pp. 103195-103202.

Alenezi, MR, Alshammari, AS, Alzanki, TH, Jarowski, P, Henley, SJ and Silva, SRP (2014) ZnO Nanodisk Based UV Detectors with Printed Electrodes LANGMUIR, 30 (13). pp. 3913-3921.

Alzanki, T, Bennett, N, Gwilliam, R, Jeynes, C, Bailey, P, Noakes, T and Sealy, B (2014) Ion Beam Analysis for Hall Scattering Factor Measurements in Antimony Implanted Bulk and Strained Silicon JOURNAL OF ENGINEERING RESEARCH, 2 (1). pp. 121-132.

Alenezi, MR, Alzanki, TH, Almeshal, AM, Alshammari, AS, Beliatis, MJ, Henley, SJ and Silva, SRP (2014) Hierarchically designed ZnO nanostructure based high performance gas sensors RSC ADVANCES, 4 (90). pp. 49521-49528.

Alzanki, T, Bennett, N, Gwilliam, R, Jeynes, C, Sealy, B, Bailey, P and Noakes, T (2014) Ion beam analysis for hall scattering factor measurements in antimony implanted bulk and strained silicon Journal of Engineering Research, 2 (1). pp. 122-132.

Sealy, BJ, Smith, AJ, Alzanki, T, Bennett, N, Li, L, Jeynes, C, Colombeau, B, Collart, EJH, Emerson, NG, Gwilliam, RM and Cowern, NEB (2006) Shallow junctions in silicon via low thermal budget processing Extended Abstracts of the Sixth International Workshop on Junction Technology, IWJT '06. pp. 10-15.

Alzanki, T, Gwilliam, R, Emerson, NG and Sealy, BJ (2004) Low-temperature processing of antimony-implanted silicon JOURNAL OF ELECTRONIC MATERIALS, 33 (7). pp. 767-769.

Alzanki, T, Gwilliam, R, Emerson, N, Tabatabaian, Z, Jeynes, C and Sealy, BJ (2004) Concentration profiles of antimony-doped shallow layers in silicon SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 19 (6), PII S0. pp. 728-732.

Alzanki, T, Gwilliam, R, Emerson, N and Sealy, B J (2004) Differential Hall Effect Profiling of Ultrashallow Junctions in Sb Implanted Silicon Applied Physics Letters, 85 (11).

Conference or Workshop Item

Alzanki, T, Gwilliam, R, Emerson, N, Smith, A, Webb, R and Sealy, BJ (2006) Electrical profiles of 20 nm junctions in Sb implanted silicon In: 14th International Conference on Ion Beam Modification of Materials (IBMM 2004), 2004-09-05 - 2004-09-10, Pacific Grove, CA.

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